Works in Technometrics, 1990, Vol 32, Issue 4

Results: 40

    • Book reviews.

      Published in:
      1990
      By:
      • Ziegel, Eric R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Ziegel, Eric R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Ziegel, Eric R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Brooks, Daniel G.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Thomas, Edward V.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Magoun, A. Dale
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Hand, David J.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Jolliffe, Ian T.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Beggs, William J.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • McArthur, Richard D.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Otto, Gordon H.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Ziegel, Eric R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • McComb, Mark Anthony
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Propst, Annabeth
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Placzkowski, Gene
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Sheesley, John H.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Jones, Peter W.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Farnsworth, David L.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Gunst, Richard F.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Ziegel, Eric R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Stephenson, W. R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Guess, Frank M.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Lenth, Russell V.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Lee, Haelie
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Ziegel, Eric R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Ziegel, Eric R.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Sposito, Vince A.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Iyer, Hari
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Derringer, George C.
      Publication type:
      Book Review

    • Book reviews.

      Published in:
      1990
      By:
      • Buckingham, Janet
      Publication type:
      Book Review

    • Confidence intervals and bounds for a ratio of summed expected mean squares.

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 437, doi. 10.1080/00401706.1990.10484730
      By:
      • Birch, Nancy J.;
      • Burdick, Richard K.
      Publication type:
      Article

    • A large-sample confidence region useful in characterizing the stationary point of a quadratic ...

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 425, doi. 10.1080/00401706.1990.10484729
      By:
      • Carter Jr., Walter H.;
      • Chinchilli, Vernon M.
      Publication type:
      Article

    • Design aspects of regression-based ratio estimation.

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 417, doi. 10.1080/00401706.1990.10484728
      By:
      • McDonald, Gary C.;
      • Studden, William J.
      Publication type:
      Article

    • Bayesian reliability analysis of complex series...

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 407, doi. 10.1080/00401706.1990.10484727
      By:
      • Martz, H. F.;
      • Waller, R. A.
      Publication type:
      Article

    • Adaptive procedures for the two-stage group-testing...

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 397, doi. 10.1080/00401706.1990.10484726
      By:
      • Schneider, Helmut;
      • Tang, Kwei
      Publication type:
      Article

    • Response.

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 393, doi. 10.1080/00401706.1990.10484725
      By:
      • Reynolds Jr., Marion R.;
      • Amin, Raid W.
      Publication type:
      Article

    • Discussion.

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 389, doi. 10.1080/00401706.1990.10484724
      By:
      • Woodall, William H.
      Publication type:
      Article

    • Discussion.

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 387, doi. 10.1080/00401706.1990.10484723
      By:
      • Lucas, James M.;
      • Saccucci, Michael S.
      Publication type:
      Article

    • Discussion.

      Published in:
      1990
      By:
      • Healy, John
      Publication type:
      Editorial

    • CUSUM charts with variable sampling intervals.

      Published in:
      Technometrics, 1990, v. 32, n. 4, p. 371, doi. 10.1080/00401706.1990.10484721
      By:
      • Reynolds Jr., Marion R.;
      • Amin, Raid W.
      Publication type:
      Article