Works in Technometrics, 1990, Vol 32, Issue 4
31
- Technometrics, 1990, v. 32, n. 4, p. 437, doi. 10.1080/00401706.1990.10484730
- Birch, Nancy J.;
- Burdick, Richard K.
- Article
32
- Technometrics, 1990, v. 32, n. 4, p. 425, doi. 10.1080/00401706.1990.10484729
- Carter Jr., Walter H.;
- Chinchilli, Vernon M.
- Article
33
- Technometrics, 1990, v. 32, n. 4, p. 417, doi. 10.1080/00401706.1990.10484728
- McDonald, Gary C.;
- Studden, William J.
- Article
34
- Technometrics, 1990, v. 32, n. 4, p. 407, doi. 10.1080/00401706.1990.10484727
- Martz, H. F.;
- Waller, R. A.
- Article
35
- Technometrics, 1990, v. 32, n. 4, p. 397, doi. 10.1080/00401706.1990.10484726
- Schneider, Helmut;
- Tang, Kwei
- Article
36
- Technometrics, 1990, v. 32, n. 4, p. 393, doi. 10.1080/00401706.1990.10484725
- Reynolds Jr., Marion R.;
- Amin, Raid W.
- Article
37
- Technometrics, 1990, v. 32, n. 4, p. 389, doi. 10.1080/00401706.1990.10484724
- Article
38
- Technometrics, 1990, v. 32, n. 4, p. 387, doi. 10.1080/00401706.1990.10484723
- Lucas, James M.;
- Saccucci, Michael S.
- Article
40
- Technometrics, 1990, v. 32, n. 4, p. 371, doi. 10.1080/00401706.1990.10484721
- Reynolds Jr., Marion R.;
- Amin, Raid W.
- Article