One‐step deposition of nano‐to‐micron‐scalable, high‐quality digital image correlation patterns for high‐strain in‐situ multi‐microscopy testing.Published in:Strain, 2019, v. 55, n. 6, p. N.PAG, doi. 10.1111/str.12330By:Hoefnagels, J.P.M.;Maris, M.P.F.H.L.;Vermeij, T.Publication type:Article
Effect of continuous strain path changes on forming limit strains of DP600.Published in:Strain, 2019, v. 55, n. 6, p. N.PAG, doi. 10.1111/str.12329By:Song, Xiao;Leotoing, Lionel;Guines, Dominique;Ragneau, EricPublication type:Article
Evaluation of stress concentration of U‐shaped notch based on residual magnetic field measurements.Published in:Strain, 2019, v. 55, n. 6, p. N.PAG, doi. 10.1111/str.12328By:Bao, Sheng;Jin, Pengfei;Zhao, Zhengye;Luo, QiangPublication type:Article
Issue Information.Published in:Strain, 2019, v. 55, n. 6, p. N.PAG, doi. 10.1111/str.12287Publication type:Article