Works matching IS 00279501 AND DT 2010 AND VI 211


Results: 17
    1

    MATURING DEBT AND DEFAULT RISKS.

    Published in:
    National Institute Economic Review, 2010, v. 211, p. F63, doi. 10.1177/0027950110364096
    By:
    • Foley-Fisher, Nathan
    Publication type:
    Article
    2

    PROSPECTS FOR THE UK ECONOMY.

    Published in:
    National Institute Economic Review, 2010, v. 211, p. F43, doi. 10.1177/0027950110364094
    By:
    • Kirby, Simon;
    • Whitworth, Rachel;
    • Foley-Fisher, Nathan
    Publication type:
    Article
    3
    4
    5

    China and world trade.

    Published in:
    National Institute Economic Review, 2010, v. 211, p. F25, doi. 10.1177/002795011021100107
    By:
    • Holland, Dawn;
    • Barrell, Ray;
    • Fic, Tatiana;
    • Hurst, Ian;
    • Liadze, Iana;
    • Orazgani, Ali;
    • Whitworth, Rachel
    Publication type:
    Article
    6

    North American responses to the global downturn.

    Published in:
    National Institute Economic Review, 2010, v. 211, p. F22, doi. 10.1177/002795011021100106
    By:
    • Holland, Dawn;
    • Barrell, Ray;
    • Fic, Tatiana;
    • Hurst, Ian;
    • Liadze, Iana;
    • Orazgani, Ali;
    • Whitworth, Rachel
    Publication type:
    Article
    7

    Summary of key forecast assumptions.

    Published in:
    National Institute Economic Review, 2010, v. 211, p. F17, doi. 10.1177/002795011021100105
    By:
    • Holland, Dawn;
    • Barrell, Ray;
    • Fic, Tatiana;
    • Hurst, Ian;
    • Liadze, Iana;
    • Orazgani, Ali;
    • Whitworth, Rachel
    Publication type:
    Article
    8

    OECD will regain pre-crisis levels of output in 2011.

    Published in:
    National Institute Economic Review, 2010, v. 211, p. F12, doi. 10.1177/0027950110364092
    By:
    • Holland, Dawn;
    • Barrell, Ray;
    • Fic, Tatiana;
    • Hurst, Ian;
    • Liadze, Iana;
    • Orazgani, Ali;
    • Whitworth, Rachel
    Publication type:
    Article
    9
    10

    The UK economy.

    Published in:
    National Institute Economic Review, 2010, v. 211, p. F3, doi. 10.1177/0027950101021200108
    Publication type:
    Article
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