Works matching IS 00263672 AND DT 2008 AND VI 161 AND IP 3/4

Results: 32

Improvements in trace element detection in energy dispersive spectrometry using an X-ray filter (FEDS) and applications to petrological problems.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 337, doi. 10.1007/s00604-007-0890-0

By:

Cossio, Roberto;
Vaggelli, Gloria;
Borghi, Alessandro

Publication type:

Article

SIMS analysis of chlorine in metasomatised upper-mantle rocks.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 329, doi. 10.1007/s00604-007-0850-8

By:

Ottolini, Luisa P.;
Fèvre, Brieuc Le

Publication type:

Article

Investigation of the relative sensitivity factor for the quantification of ion microprobe results for Nd isotopes in simulated nuclear fuel.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 479, doi. 10.1007/s00604-007-0895-8

By:

Portier, Stéphane;
Brémier, Stéphane;
Hasnaoui, Rachid;
Bildstein, Olivier;
Walker, Clive T.

Publication type:

Article

The M emission spectra of the heavy rare earth elements 67 ≤ Z ≤ 71.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 475, doi. 10.1007/s00604-007-0873-1

By:

Dellith, Jan;
Wendt, Michael

Publication type:

Article

Conventional wavelength dispersive spectroscopy versus parallel beam spectroscopy – a basic overview.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 287, doi. 10.1007/s00604-007-0865-1

By:

Van Hoek, Corrie;
Koolwijk, Max

Publication type:

Article

Application of EPMA and analytical TEM to brazed metal-supported catalytic converters.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 405, doi. 10.1007/s00604-007-0891-z

By:

Richter, Silvia;
Bode, Hans;
Dimyati, Arbi;
Mayer, Joachim

Publication type:

Article

Electron beam and Mössbauer techniques combined to optimise base metal partitioning in the furnace.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 445, doi. 10.1007/s00604-008-0954-9

By:

Andrews, Lesley;
Pistorius, Chris P.;
Waanders, Frans B.

Publication type:

Article

Applications of microanalysis in the cultural heritage field.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 295, doi. 10.1007/s00604-007-0902-0

By:

Joosten, Ineke

Publication type:

Article

First X-ray fluorescence excited Kossel diffraction in SEM.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 455, doi. 10.1007/s00604-007-0906-9

By:

Langer, Enrico;
Haschke, Michael;
Däbritz, Siegfried

Publication type:

Article

Van Gogh’s painting grounds: an examination of barium sulphate extender using analytical electron microscopy – SEM/FIB/TEM/EDX.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 363, doi. 10.1007/s00604-007-0910-0

By:

Haswell, R.;
Zeile, U.;
Mensch, K.

Publication type:

Article

Application of EPMA and XRF for the investigation of particulate pollutants in the field of cultural heritage.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 465, doi. 10.1007/s00604-007-0917-6

By:

Kontozova-Deutsch, Velichka;
Deutsch, Felix;
Godoi, Ricardo H. M.;
Spolnik, Zoya;
Wei, William;
Van Grieken, René

Publication type:

Article

Soluble fraction of stabilising elements in ferritic stainless steel.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 323, doi. 10.1007/s00604-007-0925-6

By:

Almagro, Juan F.;
Llovet, Xavier;
Heredia, M. Auxiliadora;
Luna, Carmen;
Sánchez, Rafael

Publication type:

Article

Combined cathodoluminescence spectroscopy, electron microprobe and laser ablation ICP mass spectrometry analysis: an attempt to correlate luminescence and chemical composition of monazite.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 313, doi. 10.1007/s00604-007-0919-4

By:

Vaggelli, Gloria;
Cossio, Roberto;
Petrelli, Maurizio;
Rossetti, Piergiorgio

Publication type:

Article

Volume and composition surface changes in alkali silicate glass irradiated with electrons.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 377, doi. 10.1007/s00604-008-0941-1

By:

Jurek, Karel;
Gedeon, Ondrej

Publication type:

Article

Model-based quantification of EELS: is standardless quantification possible?

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 439, doi. 10.1007/s00604-008-0948-7

By:

Verbeeck, Jo;
Bertoni, Giovanni

Publication type:

Article

Monte Carlo calculations in X-ray microanalysis of epitaxial layers.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 459, doi. 10.1007/s00604-008-0955-8

By:

Popova, Tatiana B.;
Flegontova, Ekaterina Yu.;
Bakaleinikov, Leonid A.;
Zamoryanskaya, Mariya V.

Publication type:

Article

Chemical and microstructural characterization of natural hydroxyapatite derived from pig bones.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 349, doi. 10.1007/s00604-007-0864-2

By:

Janus, Anna Maria;
Faryna, Marek;
Haberko, Krzysztof;
Rakowska, Anna;
Panz, Tomasz

Publication type:

Article

Study of structural material resulting from the nuclear fuel cycle using SEM-WDX, EPMA and SIMS techniques.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 355, doi. 10.1007/s00604-007-0852-6

By:

Lamontagne, Jérôme;
Eysseric, Catherine;
Desgranges, Lionel;
Valot, Christophe;
Noirot, Jean;
Blay, Thierry;
Roure, Ingrid;
Pasquet, Bertrand

Publication type:

Article

About the N-series X-ray lines in the electron excited spectra of heavy elements.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 471, doi. 10.1007/s00604-007-0876-y

By:

Scheffel, Andy;
Dellith, Jan;
Wendt, Michael

Publication type:

Article

Analysis of ultra light elements with newly developed ultra-soft X-ray spectrometer for electron probe microanalysis.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 451, doi. 10.1007/s00604-007-0877-x

By:

Ogiwara, Toshiya;
Kimura, Takashi;
Fukushima, Sei;
Tsukamoto, Kazunori;
Tazawa, Toyohiko;
Tanuma, Shigeo

Publication type:

Article

New model ultra-soft X-ray spectrometer for microanalysis.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 399, doi. 10.1007/s00604-007-0889-6

By:

Fukushima, Sei;
Kimura, Takashi;
Ogiwara, Toshiya;
Tsukamoto, Kazunori;
Tazawa, Toyohiko;
Tanuma, Shigeo

Publication type:

Article

Modern developments and applications in microbeam analysis. Proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6–10, 2007.

Published in:

2008

By:

Van't dack, Luc;
Gijbels, Renaat;
Walker, Clive T.

Publication type:

Editorial

Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 421, doi. 10.1007/s00604-007-0853-5

By:

Schaffer, Miroslava;
Wagner, Julian

Publication type:

Article

Light elements microanalysis of steel/B4C melts for nuclear power plants accident studies.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 343, doi. 10.1007/s00604-007-0855-3

By:

Joao, Sergio Sao;
Duriez, Christian;
Dominguez, Cristina;
Jacquemain, Didier

Publication type:

Article

A SIMS study of lithium, boron and chlorine in basalts from Reykjanes (southwestern Iceland).

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 307, doi. 10.1007/s00604-007-0922-9

By:

Raffone, Nicola;
Ottolini, Luisa;
Tonarini, Sonia;
Gianelli, Giovanni;
Fridleifsson, Gudmundur Ómar

Publication type:

Article

Virtual standard for wavelength-dispersive electron-probe microanalysis.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 427, doi. 10.1007/s00604-007-0856-2

By:

Merlet, Claude;
Llovet, Xavier;
Dugne, Olivier;
Brémier, Stephan;
Van Renterghem, Wouter;
Restani, Renato

Publication type:

Article

X-ray fluorescence as an additional analytical method for a scanning electron microscope.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 413, doi. 10.1007/s00604-007-0854-4

By:

Procop, Mathias;
Hodoroaba, Vasile-Dan

Publication type:

Article

Micro X-ray fluorescence as a potential technique to monitor in-situ air pollution.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 301, doi. 10.1007/s00604-007-0903-z

By:

Bontempi, Elza;
Bertuzzi, Raffaella;
Ferretti, Enrica;
Zucca, Marcello;
Apostoli, Pietro;
Tenini, Stefano;
Depero, Laura E.

Publication type:

Article

Investigation of In x Ga1− x N layers by local methods.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 371, doi. 10.1007/s00604-007-0896-7

By:

Domracheva, Yana V.;
Bakaleinikov, Leonid A.;
Flegontova, Ekaterina Yu.;
Jmerik, Valentin N.;
Popova, Tatiana B.;
Zamoryanskaya, Maria V.

Publication type:

Article

Combined SEM-EDX and μ-Raman spectroscopy for the characterisation of glass/Al-rich refractory interfaces.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 381, doi. 10.1007/s00604-007-0898-5

By:

Falcone, Roberto;
Galinetto, Pietro;
Messiga, Bruno;
Negri, Elisabetta;
Riccardi, Maria P.;
Sommariva, Giuseppe;
Verità, Marco

Publication type:

Article

Applications of focused ion beam SIMS in materials science.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 387, doi. 10.1007/s00604-007-0913-x

By:

McPhail, David S.;
Chater, Richard J.;
Li, Libing

Publication type:

Article

Multilayers for light element electron probe microanalysis.

Published in:

Microchimica Acta, 2008, v. 161, n. 3/4, p. 433, doi. 10.1007/s00604-007-0892-y

By:

Reed, Stephen J. B.

Publication type:

Article

Works matching IS 00263672 AND DT 2008 AND VI 161 AND IP 3/4

Improvements in trace element detection in energy dispersive spectrometry using an X-ray filter (FEDS) and applications to petrological problems.

SIMS analysis of chlorine in metasomatised upper-mantle rocks.

Investigation of the relative sensitivity factor for the quantification of ion microprobe results for Nd isotopes in simulated nuclear fuel.

The M emission spectra of the heavy rare earth elements 67 ≤ Z ≤ 71.

Conventional wavelength dispersive spectroscopy versus parallel beam spectroscopy – a basic overview.

Application of EPMA and analytical TEM to brazed metal-supported catalytic converters.

Electron beam and Mössbauer techniques combined to optimise base metal partitioning in the furnace.

Applications of microanalysis in the cultural heritage field.

First X-ray fluorescence excited Kossel diffraction in SEM.

Van Gogh’s painting grounds: an examination of barium sulphate extender using analytical electron microscopy – SEM/FIB/TEM/EDX.

Application of EPMA and XRF for the investigation of particulate pollutants in the field of cultural heritage.

Soluble fraction of stabilising elements in ferritic stainless steel.

Combined cathodoluminescence spectroscopy, electron microprobe and laser ablation ICP mass spectrometry analysis: an attempt to correlate luminescence and chemical composition of monazite.

Volume and composition surface changes in alkali silicate glass irradiated with electrons.

Model-based quantification of EELS: is standardless quantification possible?

Monte Carlo calculations in X-ray microanalysis of epitaxial layers.

Chemical and microstructural characterization of natural hydroxyapatite derived from pig bones.

Study of structural material resulting from the nuclear fuel cycle using SEM-WDX, EPMA and SIMS techniques.

About the N-series X-ray lines in the electron excited spectra of heavy elements.

Analysis of ultra light elements with newly developed ultra-soft X-ray spectrometer for electron probe microanalysis.

New model ultra-soft X-ray spectrometer for microanalysis.

Modern developments and applications in microbeam analysis. Proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6–10, 2007.

Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope.

Light elements microanalysis of steel/B<sub>4</sub>C melts for nuclear power plants accident studies.

A SIMS study of lithium, boron and chlorine in basalts from Reykjanes (southwestern Iceland).

Virtual standard for wavelength-dispersive electron-probe microanalysis.

X-ray fluorescence as an additional analytical method for a scanning electron microscope.

Micro X-ray fluorescence as a potential technique to monitor in-situ air pollution.

Investigation of In<sub> x </sub>Ga<sub>1− x </sub>N layers by local methods.

Combined SEM-EDX and μ-Raman spectroscopy for the characterisation of glass/Al-rich refractory interfaces.

Applications of focused ion beam SIMS in materials science.

Multilayers for light element electron probe microanalysis.