Works matching IS 00224715 AND DT 2013 AND VI 150 AND IP 1


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    Trapping in the Random Conductance Model.

    Published in:
    Journal of Statistical Physics, 2013, v. 150, n. 1, p. 66, doi. 10.1007/s10955-012-0688-2
    By:
    • Biskup, M.;
    • Louidor, O.;
    • Rozinov, A.;
    • Vandenberg-Rodes, A.
    Publication type:
    Article
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