Works matching IS 00222720 AND DT 2024 AND VI 295 AND IP 3
Results: 8
Current opinion on the prospect of mapping electronic orbitals in the transmission electron microscope: State of the art, challenges and perspectives.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 217, doi. 10.1111/jmi.13321
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High‐speed 4‐dimensional scanning transmission electron microscopy using compressive sensing techniques.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 278, doi. 10.1111/jmi.13315
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Study of curtaining effect reduction methods in Inconel 718 using a plasma focused ion beam.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 287, doi. 10.1111/jmi.13320
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Analysis of microscopy techniques to measure segregation in continuous‐cast steel slabs.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 266, doi. 10.1111/jmi.13310
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Studying crystallisation processes using electron microscopy: The importance of sample preparation.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 243, doi. 10.1111/jmi.13300
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Single‐shot differential phase contrast microscopy using ring‐shaped polarisation multiplexing illumination.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 257, doi. 10.1111/jmi.13309
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- Article
Enhancing resolution and contrast in fibre bundle‐based fluorescence microscopy using generative adversarial network.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 236, doi. 10.1111/jmi.13296
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- Article
TOC ‐ Issue Information.
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- Journal of Microscopy, 2024, v. 295, n. 3, p. 215, doi. 10.1111/jmi.13202
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- Article