A new method for calculating interplanar spacing to distinguish between similar phases in EBSD.
- Published in:
- Journal of Microscopy, 2023, v. 291, n. 2, p. 186, doi. 10.1111/jmi.13209
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- Publication type:
- Article
Works matching IS 00222720 AND DT 2023 AND VI 291 AND IP 2
Results: 6
1
2
Optimized dopant imaging for GaN by a scanning electron microscopy.
- Published in:
- Journal of Microscopy, 2023, v. 291, n. 2, p. 177, doi. 10.1111/jmi.13206
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- Publication type:
- Article
3
Towards artefact‐free AFM image presentation and interpretation.
- Published in:
- Journal of Microscopy, 2023, v. 291, n. 2, p. 163, doi. 10.1111/jmi.13193
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- Publication type:
- Article
4
Self‐marked preparation of site‐specific transmission electron microscope lamellae of nanodevices using focusing ion beam technique.
- Published in:
- Journal of Microscopy, 2023, v. 291, n. 2, p. 156, doi. 10.1111/jmi.13191
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- Publication type:
- Article
5
Thickness measurement of cell walls of closed‐cell foams in micro‐CT images.
- Published in:
- Journal of Microscopy, 2023, v. 291, n. 2, p. 145, doi. 10.1111/jmi.13190
- By:
- Publication type:
- Article
6
TOC ‐ Issue Information.
- Published in:
- Journal of Microscopy, 2023, v. 291, n. 2, p. 143, doi. 10.1111/jmi.13119
- Publication type:
- Article