Works matching IS 00222720 AND DT 2020 AND VI 279 AND IP 3

Results: 21

Guest Editor's Foreword, Special Issue Introduction and Scientific Highlights.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 141, doi. 10.1111/jmi.12941

By:

HAIGH, SARAH;
CLARK, NICK

Publication type:

Article

Metal configurations on 2D materials investigated via atomic resolution HAADF stem.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 274, doi. 10.1111/jmi.12902

By:

COURTNEY, E.;
CONROY, M.;
BANGERT, U.

Publication type:

Article

Multislice image simulations of sheared needle‐like precipitates in an Al‐Mg‐Si alloy.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 265, doi. 10.1111/jmi.12901

By:

CHRISTIANSEN, E.;
RINGDALEN, I.G.;
BJØRGE, R.;
MARIOARA, C.D.;
HOLMESTAD, R.

Publication type:

Article

Plasmons in MoS<sub>2</sub> studied via experimental and theoretical correlation of energy loss spectra.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 256, doi. 10.1111/jmi.12900

By:

MOYNIHAN, EOIN;
ROST, STEFAN;
O'CONNELL, EOGHAN;
RAMASSE, QUENTIN;
FRIEDRICH, CHRISTOPH;
BANGERT, URSEL

Publication type:

Article

In‐situ SEM observation of grain growth in the austenitic region of carbon steel using thermal etching.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 249, doi. 10.1111/jmi.12894

By:

HEARD, R.;
DRAGNEVSKI, K.I.;
SIVIOUR, C.R.

Publication type:

Article

Low damage lamella preparation of metallic materials by FIB processing with low acceleration voltage and a low incident angle Ar ion milling finish.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 234, doi. 10.1111/jmi.12878

By:

SATO, T.;
AIZAWA, Y.;
MATSUMOTO, H.;
KIYOHARA, M.;
KAMIYA, C.;
VON CUBE, F.

Publication type:

Article

Electron Compton scattering and the measurement of electron momentum distributions in solids.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 185, doi. 10.1111/jmi.12854

By:

TALMANTAITE, A.;
HUNT, M.R.C.;
MENDIS, B.G.

Publication type:

Article

HAADF‐STEM image analysis for size‐selected platinum nanoclusters.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 229, doi. 10.1111/jmi.12877

By:

XIA, Y.;
HARRISON, P.;
ORNELAS, I.M.;
WANG, H.L.;
LI, Z.Y.

Publication type:

Article

TOC ‐ Issue Information.

Published in:: Journal of Microscopy, 2020, v. 279, n. 3, p. 139, doi. 10.1111/jmi.12815
Publication type:: Article

End‐to‐end image analysis pipeline for liquid‐phase electron microscopy.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 242, doi. 10.1111/jmi.12889

By:

MARCHELLO, G.;
DE PACE, C.;
DURO‐CASTANO, A.;
BATTAGLIA, G.;
RUIZ‐PÉREZ, L.

Publication type:

Article

Rapid polarization mapping in ferroelectrics using Fourier masking.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 222, doi. 10.1111/jmi.12876

By:

MOORE, K.;
CONROY, M.;
BANGERT, U.

Publication type:

Article

High‐resolution imaging of organic pharmaceutical crystals by transmission electron microscopy and scanning moiré fringes.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 197, doi. 10.1111/jmi.12866

By:

S'ARI, M.;
KONIUCH, N.;
BRYDSON, R.;
HONDOW, N.;
BROWN, A.

Publication type:

Article

In situ heating TEM observations of evolving nanoscale Al–Mg–Si–Cu precipitates.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 143, doi. 10.1111/jmi.12845

By:

SUNDE, JONAS KRISTOFFER;
WENNER, SIGURD;
HOLMESTAD, RANDI

Publication type:

Article

Effect of annealing on the magnetic states of FEBID‐grown cobalt nanopatterns examined by off‐axis electron holography.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 217, doi. 10.1111/jmi.12869

By:

ALMEIDA, T.;
MCGROUTHER, D.;
KOVÁCS, A.;
DUNIN‐BORKOWSKI, R.;
MCVITIE, S.

Publication type:

Article

Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 212, doi. 10.1111/jmi.12868

By:

ROBERTSON, STUART;
DOAK, SCOTT;
SUN, FU‐LONG;
LIU, ZHI‐QUAN;
LIU, CHANGQING;
ZHOU, ZHAOXIA

Publication type:

Article

Next generation secondary electron detector with energy analysis capability for SEM.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 207, doi. 10.1111/jmi.12867

By:

SURI, A.;
PRATT, A.;
TEAR, S.;
WALKER, C.;
EL‐GOMATI, M.

Publication type:

Article

Unravelling the ultrastructural details of αT‐catenin‐deficient cell–cell contacts between heart muscle cells by the use of FIB‐SEM.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 189, doi. 10.1111/jmi.12855

By:

VANSLEMBROUCK, B.;
KREMER, A.;
VAN ROY, F.;
LIPPENS, S.;
VAN HENGEL, J.

Publication type:

Article

Application of automated electron microscopy imaging and machine learning to characterise and quantify nanoparticle dispersion in aqueous media.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 177, doi. 10.1111/jmi.12853

By:

ILETT, M.;
WILLS, J.;
REES, P.;
SHARMA, S.;
MICKLETHWAITE, S.;
BROWN, A.;
BRYDSON, R.;
HONDOW, N.

Publication type:

Article

Nanocrystal segmentation in scanning precession electron diffraction data.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 158, doi. 10.1111/jmi.12850

By:

BERGH, T.;
JOHNSTONE, D.N.;
CROUT, P.;
HØGÅS, S.;
MIDGLEY, P.A.;
HOLMESTAD, R.;
VULLUM, P.E.;
HELVOORT, A.T.J. VAN

Publication type:

Article

Direct measurement of TEM lamella thickness in FIB‐SEM.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 168, doi. 10.1111/jmi.12852

By:

CONLAN, A.P.;
TILLOTSON, E.;
RAKOWSKI, A.;
COOPER, D.;
HAIGH, S.J.

Publication type:

Article

Characterisation of the microplasma spraying of biocompatible coating of titanium.

Published in:

Journal of Microscopy, 2020, v. 279, n. 3, p. 148, doi. 10.1111/jmi.12849

By:

ALONTSEVA, D.L.;
GHASSEMIEH, E.;
VOINAROVYCH, S.;
RUSSAKOVA, A.;
KYSLYTSIA, O.;
POLOVETSKYI, Y.;
TOXANBAYEVA, A.

Publication type:

Article