Works matching IS 00222720 AND DT 2020 AND VI 279 AND IP 3
Results: 21
Guest Editor's Foreword, Special Issue Introduction and Scientific Highlights.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 141, doi. 10.1111/jmi.12941
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Metal configurations on 2D materials investigated via atomic resolution HAADF stem.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 274, doi. 10.1111/jmi.12902
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Multislice image simulations of sheared needle‐like precipitates in an Al‐Mg‐Si alloy.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 265, doi. 10.1111/jmi.12901
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Plasmons in MoS<sub>2</sub> studied via experimental and theoretical correlation of energy loss spectra.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 256, doi. 10.1111/jmi.12900
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In‐situ SEM observation of grain growth in the austenitic region of carbon steel using thermal etching.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 249, doi. 10.1111/jmi.12894
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End‐to‐end image analysis pipeline for liquid‐phase electron microscopy.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 242, doi. 10.1111/jmi.12889
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Low damage lamella preparation of metallic materials by FIB processing with low acceleration voltage and a low incident angle Ar ion milling finish.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 234, doi. 10.1111/jmi.12878
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HAADF‐STEM image analysis for size‐selected platinum nanoclusters.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 229, doi. 10.1111/jmi.12877
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Rapid polarization mapping in ferroelectrics using Fourier masking.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 222, doi. 10.1111/jmi.12876
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Effect of annealing on the magnetic states of FEBID‐grown cobalt nanopatterns examined by off‐axis electron holography.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 217, doi. 10.1111/jmi.12869
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Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 212, doi. 10.1111/jmi.12868
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Next generation secondary electron detector with energy analysis capability for SEM.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 207, doi. 10.1111/jmi.12867
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High‐resolution imaging of organic pharmaceutical crystals by transmission electron microscopy and scanning moiré fringes.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 197, doi. 10.1111/jmi.12866
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Unravelling the ultrastructural details of αT‐catenin‐deficient cell–cell contacts between heart muscle cells by the use of FIB‐SEM.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 189, doi. 10.1111/jmi.12855
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Electron Compton scattering and the measurement of electron momentum distributions in solids.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 185, doi. 10.1111/jmi.12854
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Application of automated electron microscopy imaging and machine learning to characterise and quantify nanoparticle dispersion in aqueous media.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 177, doi. 10.1111/jmi.12853
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Direct measurement of TEM lamella thickness in FIB‐SEM.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 168, doi. 10.1111/jmi.12852
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Nanocrystal segmentation in scanning precession electron diffraction data.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 158, doi. 10.1111/jmi.12850
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Characterisation of the microplasma spraying of biocompatible coating of titanium.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 148, doi. 10.1111/jmi.12849
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In situ heating TEM observations of evolving nanoscale Al–Mg–Si–Cu precipitates.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 143, doi. 10.1111/jmi.12845
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TOC ‐ Issue Information.
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- Journal of Microscopy, 2020, v. 279, n. 3, p. 139, doi. 10.1111/jmi.12815
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