Works matching IS 00222720 AND DT 2016 AND VI 262 AND IP 2
Results: 10
In situ electronic probing of semiconducting nanowires in an electron microscope.
- Published in:
- Journal of Microscopy, 2016, v. 262, n. 2, p. 183, doi. 10.1111/jmi.12328
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- Article
Preface of 19<sup>th</sup> Microscopy of Semiconducting Materials conference.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 131, doi. 10.1111/jmi.12391
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- Article
Automated background subtraction technique for electron energy-loss spectroscopy and application to semiconductor heterostructures.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 157, doi. 10.1111/jmi.12397
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- Article
Interfacial chemistry in a ZnTe/CdSe superlattice studied by atom probe tomography and transmission electron microscopy strain measurements.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 178, doi. 10.1111/jmi.12340
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- Article
TOC - Issue Information.
- Published in:
- Journal of Microscopy, 2016, v. 262, n. 2, p. 129, doi. 10.1111/jmi.12411
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- Article
Nanowire-based structures for infrared to ultraviolet emitters studied by cathodoluminescence.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 134, doi. 10.1111/jmi.12296
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- Article
Electron energy loss spectroscopy on semiconductor heterostructures for optoelectronics and photonics applications.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 142, doi. 10.1111/jmi.12298
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- Article
Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 167, doi. 10.1111/jmi.12285
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- Article
Local sample thickness determination via scanning transmission electron microscopy defocus series.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 171, doi. 10.1111/jmi.12284
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- Publication type:
- Article
Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope.
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- Journal of Microscopy, 2016, v. 262, n. 2, p. 151, doi. 10.1111/jmi.12291
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- Article