Works matching IS 00222720 AND DT 2010 AND VI 237 AND IP 3
Results: 61
Recrystallization of plane strain compressed Al–1 wt.% Mn alloy single crystals of typical unstable orientations.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 221, doi. 10.1111/j.1365-2818.2009.03226.x
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TEM studies of plasma nitrided austenitic stainless steel.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 227, doi. 10.1111/j.1365-2818.2009.03228.x
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Properties and microstructure of the (Fe, Ni)–Cu–(P, Si, B) melt-spun alloys.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 232, doi. 10.1111/j.1365-2818.2009.03229.x
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HRTEM studies of amorphous ZrNiTiCu nanocrystalline composites.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 237, doi. 10.1111/j.1365-2818.2009.03230.x
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Depth measurements of etch-pits in GaN with shape reconstruction from SEM images.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 242, doi. 10.1111/j.1365-2818.2009.03232.x
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RuO<sub>2</sub> thin films deposited by spin coating on silicon substrates: pH-dependence of the microstructure and catalytic properties.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 246, doi. 10.1111/j.1365-2818.2009.03236.x
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Interactions between molten aluminum and Y<sub>2</sub>O<sub>3</sub> studied with TEM techniques.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 253, doi. 10.1111/j.1365-2818.2009.03237.x
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The effect of TMCP parameters on the microstructure and mechanical properties of Ti–Nb microalloyed steel.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 258, doi. 10.1111/j.1365-2818.2009.03238.x
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EBSD studies of microstructure and texture in Ni–Ti–Co shape memory strip and ribbon.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 263, doi. 10.1111/j.1365-2818.2009.03239.x
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TEM studies of melt-spun alloys with liquid miscibility gap.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 267, doi. 10.1111/j.1365-2818.2009.03240.x
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An investigation of nitride precipitates in archaeological iron artefacts from Poland.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 271, doi. 10.1111/j.1365-2818.2009.03241.x
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Electron microscopy investigations of V defects in multiple InGaN/GaN quantum wells and InGaN quantum dots.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 275, doi. 10.1111/j.1365-2818.2009.03242.x
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Microstructural characterization of nanocrystalline gold particles supported on CoCr<sub>2</sub>O<sub>4</sub>.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 282, doi. 10.1111/j.1365-2818.2009.03243.x
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Microstructure characterization of erosion resistant coatings on carbon-bonded carbon fibre composites.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 288, doi. 10.1111/j.1365-2818.2009.03244.x
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Electron detection in the intermediate chamber of the variable pressure SEM.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 292, doi. 10.1111/j.1365-2818.2009.03245.x
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TEM investigation of reaction zone products formed between molten Al and CoO monocrystalline substrate.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 299, doi. 10.1111/j.1365-2818.2009.03247.x
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Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 304, doi. 10.1111/j.1365-2818.2009.03248.x
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Structure investigations of nonpolar GaN layers.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 308, doi. 10.1111/j.1365-2818.2009.03249.x
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Shear banding phenomenon in a Cu–8 at.% Al alloy analysed by orientation imaging microscopy.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 314, doi. 10.1111/j.1365-2818.2009.03250.x
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Microstructure and mechanical properties of the NiNbZrTiAl amorphous alloys with 10 and 25 at.% Nb content.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 320, doi. 10.1111/j.1365-2818.2009.03251.x
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Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 325, doi. 10.1111/j.1365-2818.2009.03252.x
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Microstructure and high temperature transport properties of Ca-doped nickel oxide.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 329, doi. 10.1111/j.1365-2818.2009.03253.x
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HREM characterization of nano-composite Au/SiO<sub>2</sub> layers.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 333, doi. 10.1111/j.1365-2818.2009.03254.x
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TEM characterization of MBE grown CdTe/ZnTe axial nanowires.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 337, doi. 10.1111/j.1365-2818.2009.03256.x
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Advantages of aberration correction for HRTEM investigation of complex layer compounds.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 341, doi. 10.1111/j.1365-2818.2009.03257.x
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Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 347, doi. 10.1111/j.1365-2818.2009.03258.x
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Microstructural changes induced near crack tip during corrosion fatigue tests in austenitic-ferritic steel.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 352, doi. 10.1111/j.1365-2818.2009.03259.x
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Analysis of damaged region of carbon implanted alumina.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 359, doi. 10.1111/j.1365-2818.2009.03260.x
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Microstructural changes during creep of CMSX-4 single crystal Ni base superalloy at 750°C.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 364, doi. 10.1111/j.1365-2818.2009.03261.x
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Surface morphology of unalloyed steels remelted with intense plasma pulses.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 370, doi. 10.1111/j.1365-2818.2009.03262.x
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Structure investigations of ferromagnetic Co-Ni-Al alloys obtained by powder metallurgy.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 374, doi. 10.1111/j.1365-2818.2009.03263.x
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Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 379, doi. 10.1111/j.1365-2818.2009.03264.x
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Structural and chemical composition studies of pulsed laser deposited β-Al-Mg thin films.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 384, doi. 10.1111/j.1365-2818.2009.03266.x
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Morphology and chemical composition of Ag/Sn/Ag interconnections.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 388, doi. 10.1111/j.1365-2818.2009.03267.x
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Structural characterization of nano-sized Ce<sub>0.5</sub>Ln<sub>0.5</sub>O<sub>1.75</sub> (Ln = Yb, Lu) mixed oxides.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 391, doi. 10.1111/j.1365-2818.2009.03268.x
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Fractal-like behaviour of the BCC/FCC phase separation in the iron-gold alloys.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 395, doi. 10.1111/j.1365-2818.2009.03269.x
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The effect of strain rate on the evolution of microstructure in aluminium alloys.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 399, doi. 10.1111/j.1365-2818.2009.03271.x
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Analysis of channel shapes in track membranes by scanning electron microscopy.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 404, doi. 10.1111/j.1365-2818.2009.03272.x
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The chemical phenol extraction of intermetallic particles from casting AlSi5Cu1Mg alloy.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 407, doi. 10.1111/j.1365-2818.2009.03273.x
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The effect of carbide precipitate morphology on fracture toughness in low-tempered steels containing Ni.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 411, doi. 10.1111/j.1365-2818.2009.03275.x
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Microstructure and mechanical properties of AA7039+20%SiC<sub>w</sub> composite.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 416, doi. 10.1111/j.1365-2818.2009.03276.x
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Effect of annealing temperature on the structure and mechanical properties of mechanically alloyed AlMg–Nb<sub>2</sub>O<sub>5</sub> and AlMg–ZrSi<sub>2</sub> composites.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 421, doi. 10.1111/j.1365-2818.2009.03277.x
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Microstructure investigations of dental composite samples prepared by focused ion beam technique.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 427, doi. 10.1111/j.1365-2818.2009.03278.x
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Electron microscopy investigations of the microstructure of a CrRe alloy.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 431, doi. 10.1111/j.1365-2818.2009.03279.x
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TEM studies of the nitrided/oxided Ni–Ti surface layer.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 435, doi. 10.1111/j.1365-2818.2009.03286.x
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TEM characterization of the artefacts induced by FIB in austenitic stainless steel.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 439, doi. 10.1111/j.1365-2818.2009.03288.x
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Transmission electron microscopy of solution-processed, intrinsic and Al-doped ZnO nanowires for transparent electrode fabrication.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 443, doi. 10.1111/j.1365-2818.2009.03289.x
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Degradation of the TBC system during the static oxidation test.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 450, doi. 10.1111/j.1365-2818.2009.03290.x
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Microstructure of electrodeposited NiFe/Cu multilayers.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 456, doi. 10.1111/j.1365-2818.2009.03293.x
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TEM investigation of ductile iron alloyed with vanadium.
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- Journal of Microscopy, 2010, v. 237, n. 3, p. 461, doi. 10.1111/j.1365-2818.2009.03294.x
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