Works matching IS 00222720 AND DT 2006 AND VI 224 AND IP 1
Results: 34
Analytical transmission electron microscopy and electron diffraction for characterization of multiphase Ni-P-Ti surface layer on Ti-6Al-4V alloy.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 21, doi. 10.1111/j.1365-2818.2006.01644.x
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Influence of plastic deformation and prolonged ageing time on microstructure of a Haynes 242 alloy.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 24, doi. 10.1111/j.1365-2818.2006.01645.x
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Microstructural analysis of iron aluminide formed by self-propagating high-temperature synthesis mechanism in aluminium matrix composite.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 1, doi. 10.1111/j.1365-2818.2006.01635.x
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Influence of the processing route on microstructure and mechanical properties of the polycrystalline NiAl.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 12, doi. 10.1111/j.1365-2818.2006.01639.x
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Transmission electron microscopy investigations of AZ91 alloy deformed by equal-channel angular pressing.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 15, doi. 10.1111/j.1365-2818.2006.01640.x
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Evolution of rapidly solidified NiAlCu(B) alloy microstructure.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 18, doi. 10.1111/j.1365-2818.2006.01642.x
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Quantitative misorientation characteristics of interphase boundaries in composites.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 4, doi. 10.1111/j.1365-2818.2006.01636.x
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Microstructural changes of CM186LC single-crystal superalloy during creep deformation at 750 °C.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 8, doi. 10.1111/j.1365-2818.2006.01637.x
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Structural analyses of Nd-doped CeO<sub>2</sub> thin films deposited by pulsed laser deposition.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 49, doi. 10.1111/j.1365-2818.2006.01661.x
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Wavelength- and energy-dispersive Electron Probe Microanalysis (EPMA) measurements with non-perpendicular incidence of the electron beam.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 52, doi. 10.1111/j.1365-2818.2006.01662.x
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Transmission electron microscopy study of crystallization in Fe-Si–B–Cr–C amorphous alloy.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 27, doi. 10.1111/j.1365-2818.2006.01647.x
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Microstructure evolution in age-hardenable aluminium alloy during processing by hydrostatic extrusion.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 34, doi. 10.1111/j.1365-2818.2006.01651.x
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Transmission electron microscopy characterization of the erbium silicide formation process using a Pt/Er stack on a silicon-on-insulator substrate.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 38, doi. 10.1111/j.1365-2818.2006.01653.x
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Transmission electron microscopy studies of microstructure of Ti–Nb and Ti–Ta alloys after ball milling and hot consolidation.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 42, doi. 10.1111/j.1365-2818.2006.01655.x
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Influence of Ca content and oxygen partial pressure on microstructural evolution of (Co,Ca)O at elevated temperatures.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 30, doi. 10.1111/j.1365-2818.2006.01650.x
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Scanning and transmission electron microscopy microstructure characterization of mechanically alloyed Nb–Ti–Al alloys.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 58, doi. 10.1111/j.1365-2818.2006.01663.x
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Structural analysis and intergranular corrosion tests of AISI 316L steel.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 62, doi. 10.1111/j.1365-2818.2006.01664.x
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Structure and properties of an alumina/amorphous-alumina/platinum catalytic system deposited on FeCrAl steel.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 46, doi. 10.1111/j.1365-2818.2006.01657.x
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Scanning electron microscopy and transmission electron microscopy microstructural investigation of high-speed tool steel after Nd:YAG pulsed laser melting.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 65, doi. 10.1111/j.1365-2818.2006.01666.x
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The effect of an Ni–Cr protective layer on cyclic oxidation of Ti<sub>3</sub>Al.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 68, doi. 10.1111/j.1365-2818.2006.01667.x
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Cathodoluminescence studies of nanostructured semiconductors.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 72, doi. 10.1111/j.1365-2818.2006.01668.x
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Cathodoluminescence in transmission electron microscopy.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 79, doi. 10.1111/j.1365-2818.2006.01670.x
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In situ electron beam induced current measurements of the local thickness in semiconductor devices.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 86, doi. 10.1111/j.1365-2818.2006.01671.x
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Elimination of scanning electron microscopy image periodic distortions with digital signal-processing methods.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 89, doi. 10.1111/j.1365-2818.2006.01672.x
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Compensation of the shadowing error in three-dimensional imaging with a multiple detector scanning electron microscope.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 93, doi. 10.1111/j.1365-2818.2006.01673.x
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New system for secondary electron detection in variable-pressure scanning electron microscopy.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 97, doi. 10.1111/j.1365-2818.2006.01675.x
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New methods of track membrane treatment in the preparation of samples for further observation with scanning electron microscopy.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 100, doi. 10.1111/j.1365-2818.2006.01676.x
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Buried amorphous-layer impact on dislocation densities in silicon.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 104, doi. 10.1111/j.1365-2818.2006.01677.x
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Wing scale microstructures and nanostructures in butterflies − natural photonic crystals.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 108, doi. 10.1111/j.1365-2818.2006.01678.x
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The structure and mechanical properties of amorphous and nanocrystalline Fe–Si–B alloys.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 111, doi. 10.1111/j.1365-2818.2006.01680.x
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Characterization of the near-surface layers of carbon steels modified by interaction with intense pulsed plasma beams: scanning electron microscopy investigations.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 114, doi. 10.1111/j.1365-2818.2006.01682.x
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The effect of coarse intermetallic particles on the fracture process in forged 7000 alloys.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 117, doi. 10.1111/j.1365-2818.2006.01683.x
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Transmission electron microscopy analysis of phase separation in GaInAsSb films grown on GaSb substrate.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 121, doi. 10.1111/j.1365-2818.2006.01684.x
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Investigation of Si–Au vicinal surfaces using scanning tunnelling microscopy and reflection high-energy electron diffraction.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 125, doi. 10.1111/j.1365-2818.2006.01686.x
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