Works matching IS 00222720 AND DT 2005 AND VI 217 AND IP 3
Results: 15
Waveguide sidewall roughness measurement on full wafers by SEM-based stereoscopy.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 188, doi. 10.1111/j.1365-2818.2005.01387.x
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- Article
Imaging the substructure of antibodies with tapping-mode AFM in air: the importance of a water layer on mica.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 193, doi. 10.1111/j.1365-2818.2005.01399.x
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- Article
Simple optimization procedure for objective lens correction collar setting.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 184, doi. 10.1111/j.1365-2818.2005.01431.x
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- Article
Two-photon excitation and emission spectra of the green fluorescent protein variants ECFP, EGFP and EYFP.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 200, doi. 10.1111/j.1365-2818.2005.01437.x
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- Article
Two-photon excitation fluorescence pH detection using 2,3-dicyanohydroquinone: a spectral ratiometric approach.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 260, doi. 10.1111/j.1365-2818.2005.01442.x
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- Article
Third-order aberration theory of Wien filters for monochromators and aberration correctors.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 205, doi. 10.1111/j.1365-2818.2005.01443.x
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- Article
A simple method allowing DIC imaging in conjunction with confocal microscopy.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 265, doi. 10.1111/j.1365-2818.2005.01452.x
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- Article
Structural characterization of TiN/NbN multilayers: X-ray diffraction, energy-filtered TEM and Fresnel contrast techniques compared.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 241, doi. 10.1111/j.1365-2818.2005.01454.x
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- Article
Keyword index.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 283, doi. 10.1111/j.1365-2818.2005.1458b_k.x
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- Article
Radon track imaging in CR-39 plastic detectors using confocal scanning laser microscopy.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 179, doi. 10.1111/j.1365-2818.2005.01444.x
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- Article
Characterization of ultrafine coal fly ash particles by energy-filtered TEM.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 225, doi. 10.1111/j.1365-2818.2005.01445.x
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- Article
Author index.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 282, doi. 10.1111/j.1365-2818.2005.01458.x
- Publication type:
- Article
New technique forin-situmeasurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEM.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 235, doi. 10.1111/j.1365-2818.2005.01448.x
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- Article
A method for automated detection of gene expression required for the establishment of a digital transcriptome-wide gene expression atlas.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 275, doi. 10.1111/j.1365-2818.2005.01450.x
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- Article
The use of rhodamine 6G and fluorescence microscopy in the evaluation of phospholipid-based polymeric biomaterials.
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- Journal of Microscopy, 2005, v. 217, n. 3, p. 216, doi. 10.1111/j.1365-2818.2005.01453.x
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- Article