Works matching IS 00222720 AND DT 2004 AND VI 214 AND IP 3

Results: 15
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    FIB-induced damage in silicon.

    Published in:
    Journal of Microscopy, 2004, v. 214, n. 3, p. 213, doi. 10.1111/j.0022-2720.2004.01327.x
    By:
    • Rubanov, S.;
    • Munroe, P. R.
    Publication type:
    Article
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    X-ray omni microscopy.

    Published in:
    Journal of Microscopy, 2004, v. 214, n. 3, p. 315, doi. 10.1111/j.0022-2720.2004.01315.x
    By:
    • Paganin, D.;
    • Gureyev, T. E.;
    • Mayo, S. C.;
    • Stevenson, A. W.;
    • Nesterets, YA. I.;
    • Wilkins, S. W.
    Publication type:
    Article
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    Using the FIB to characterize nanoparticle materials.

    Published in:
    Journal of Microscopy, 2004, v. 214, n. 3, p. 222, doi. 10.1111/j.0022-2720.2004.01325.x
    By:
    • Perrey, C. R.;
    • Carter, C. B.;
    • Michael, J. R.;
    • Kotula, P. G.;
    • Stach, E. A.;
    • Radmilovic, V. R.
    Publication type:
    Article
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    Editorial.

    Published in:
    2004
    By:
    • Inkson, B. J.;
    • Newcomb, S.
    Publication type:
    Editorial
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    Application of the dual-beam FIB/SEM to metals research.

    Published in:
    Journal of Microscopy, 2004, v. 214, n. 3, p. 237, doi. 10.1111/j.0022-2720.2004.01329.x
    By:
    • Sivel, V. G. M.;
    • Van Den Brand, J.;
    • Wang, W. R.;
    • Mohdadi, H.;
    • Tichelaar, F. D.;
    • Alkemade, P. F. A.;
    • Zanbergen, H. W.
    Publication type:
    Article
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