Works matching IS 00222720 AND DT 2004 AND VI 214 AND IP 3
Results: 15
Quantitative optical microscope with enhanced resolution using a pixelated liquid crystal spatial light modulator.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 334, doi. 10.1111/j.0022-2720.2004.01323.x
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- Publication type:
- Article
About the role of the various types of secondary electrons (SE<sub>1</sub>; SE<sub>2</sub>; SE<sub>3</sub>) on the performance of LVSEM.
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- Journal of Microscopy, 2004, v. 214, n. 3, p. 341, doi. 10.1111/j.0022-2720.2004.01326.x
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- Publication type:
- Article
High-resolution wide-field surface plasmon microscopy.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 328, doi. 10.1111/j.0022-2720.2004.01309.x
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- Article
Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devices.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 287, doi. 10.1111/j.0022-2720.2004.01328.x
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- Publication type:
- Article
Using the FIB to characterize nanoparticle materials.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 222, doi. 10.1111/j.0022-2720.2004.01325.x
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- Publication type:
- Article
FIB-induced damage in silicon.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 213, doi. 10.1111/j.0022-2720.2004.01327.x
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- Publication type:
- Article
X-ray omni microscopy.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 315, doi. 10.1111/j.0022-2720.2004.01315.x
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- Article
Application of the dual-beam FIB/SEM to metals research.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 237, doi. 10.1111/j.0022-2720.2004.01329.x
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- Publication type:
- Article
Robust incremental compensation of the light attenuation with depth in 3D fluorescence microscopy.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 297, doi. 10.1111/j.0022-2720.2004.01333.x
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- Article
Editorial.
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- 2004
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- Publication type:
- Editorial
Circuit editing of copper and low- k dielectrics in nanotechnology devices.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 246, doi. 10.1111/j.0022-2720.2004.01337.x
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- Publication type:
- Article
Moderated histogram equalization, an automatic means of enhancing the contrast in digital light micrographs reversibly.
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- Journal of Microscopy, 2004, v. 214, n. 3, p. 272, doi. 10.1111/j.0022-2720.2004.01339.x
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- Publication type:
- Article
Thermal stability of Ti and Pt nanowires manufactured by Ga<sup>+</sup> focused ion beam.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 252, doi. 10.1111/j.0022-2720.2004.01344.x
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- Publication type:
- Article
Using microscopic techniques to reveal the mechanism of anion exchange in crystalline co-ordination polymers.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 261, doi. 10.1111/j.0022-2720.2004.01346.x
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- Publication type:
- Article
Transmission electron microscopy of fluorapatite–gelatine composite particles prepared using focused ion beam milling.
- Published in:
- Journal of Microscopy, 2004, v. 214, n. 3, p. 208, doi. 10.1111/j.0022-2720.2004.01352.x
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- Publication type:
- Article