Works matching IS 00222720 AND DT 2003 AND VI 210 AND IP 1

Results: 15

Analytical electron microscopy and focused ion beam: complementary tool for the imaging of copper sorption onto iron oxide aggregates.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 45, doi. 10.1046/j.1365-2818.2003.01168.x

By:

Mavrocordatos, D.;
Steiner, M.;
Boller, M.

Publication type:

Article

Foreword.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 1, doi. 10.1046/j.1365-2818.2003.01169.x

By:

Leapman, Richard

Publication type:

Article

An EELS-based study of the effects of pyrolysis on natural carbonaceous materials used for activated charcoal preparation.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 53, doi. 10.1046/j.1365-2818.2003.01170.x

By:

Jeanne-Rose, V.;
Golabkan, V.;
Mansot, J. L.;
Largitte, L.;
Césaire, T.;
Ouensanga, A.

Publication type:

Article

Chemical and physical characterization by EELS of strontium hexanoate reverse micelles and strontium carbonate nanophase produced during tribological experiments.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 110, doi. 10.1046/j.1365-2818.2003.01171.x

By:

Mansot, J. L.;
Golabkan, V.;
Romana, L.;
Césaire, T.

Publication type:

Article

EELS investigation of FeCo/SiO2 nanocomposites.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 80, doi. 10.1046/j.1365-2818.2003.01177.x

By:

Falqui, A.;
Serin, V.;
Calmels, L.;
Snoeck, E.;
Corrias, A.;
Ennas, G.

Publication type:

Article

N-K ELNES study of anisotropy effects in hexagonal AlN.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 60, doi. 10.1046/j.1365-2818.2003.01178.x

By:

Radtke, G.;
Epicier, T.;
Bayle-Guillemaud, P.;
Le Bossé, J. C.

Publication type:

Article

Successful application of spatial difference technique to electron energy-loss spectroscopy studies of Mo/SrTiO3 interfaces.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 94, doi. 10.1046/j.1365-2818.2003.01174.x

By:

Gao, M.;
Scheu, C.;
Tchernychova, E.;
Rühle, M.

Publication type:

Article

Electron energy-loss spectroscopy study of thin film hafnium aluminates for novel gate dielectrics.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 74, doi. 10.1046/j.1365-2818.2003.01175.x

By:

Stemmer, S.;
Chen, Z. Q.;
Zhu, W. J.;
Ma, T. P.

Publication type:

Article

Study of changes in L32 EELS ionization edges upon formation of Ni-based intermetallic compounds.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 102, doi. 10.1046/j.1365-2818.2003.01176.x

By:

Potapov, P. L.;
Kulkova, S. E.;
Schryvers, D.

Publication type:

Article

Subcellular localization of boron in cultured melanoma cells by electron energy-loss spectroscopy of freeze-dried cryosections.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 25, doi. 10.1046/j.1365-2818.2003.01172.x

By:

Michel, J.;
Sauerwein, W.;
Wittig, A.;
Balossier, G.;
Zierold, K.

Publication type:

Article

Detecting single atoms of calcium and iron in biological structures by electron energy-loss spectrum-imaging.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 5, doi. 10.1046/j.1365-2818.2003.01173.x

By:

Leapman, R. D.

Publication type:

Article

Electron spectroscopy imaging to study ELNES at a nanoscale.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 66, doi. 10.1046/j.1365-2818.2003.01179.x

By:

Bayle-Guillemaud, P.;
Radtke, G.;
Sennour, M.

Publication type:

Article

Electron energy-loss near edge structure (ELNES) of InGaN quantum wells.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 89, doi. 10.1046/j.1365-2818.2003.01180.x

By:

Keast, V. J.;
Kappers, M. J.;
Humphreys, C. J.

Publication type:

Article

Advances in EELS spectroscopy by using new detector and new specimen preparation technologies.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 16, doi. 10.1046/j.1365-2818.2003.01181.x

By:

Scheu, C.;
Gao, M.;
Van Benthem, K.;
Tsukimoto, S.;
Schmidt, S.;
Sigle, W.;
Richter, G.;
Thomas, J.

Publication type:

Article

Bandstructure approach to near edge structure.

Published in:

Journal of Microscopy, 2003, v. 210, n. 1, p. 35, doi. 10.1046/j.1365-2818.2003.01182.x

By:

Paxton, A. T.;
Craven, A. J.;
Gregg, J. M.;
McComb, D. W.

Publication type:

Article

Works matching IS 00222720 AND DT 2003 AND VI 210 AND IP 1

Analytical electron microscopy and focused ion beam: complementary tool for the imaging of copper sorption onto iron oxide aggregates.

Foreword.

An EELS-based study of the effects of pyrolysis on natural carbonaceous materials used for activated charcoal preparation.

Chemical and physical characterization by EELS of strontium hexanoate reverse micelles and strontium carbonate nanophase produced during tribological experiments.

EELS investigation of FeCo/SiO<sub>2</sub> nanocomposites.

N-K ELNES study of anisotropy effects in hexagonal AlN.

Successful application of spatial difference technique to electron energy-loss spectroscopy studies of Mo/SrTiO<sub>3</sub> interfaces.

Electron energy-loss spectroscopy study of thin film hafnium aluminates for novel gate dielectrics.

Study of changes in L<sub>32</sub> EELS ionization edges upon formation of Ni-based intermetallic compounds.

Subcellular localization of boron in cultured melanoma cells by electron energy-loss spectroscopy of freeze-dried cryosections.

Detecting single atoms of calcium and iron in biological structures by electron energy-loss spectrum-imaging.

Electron spectroscopy imaging to study ELNES at a nanoscale.

Electron energy-loss near edge structure (ELNES) of InGaN quantum wells.

Advances in EELS spectroscopy by using new detector and new specimen preparation technologies.

Bandstructure approach to near edge structure.