Extracting twins from orientation imaging microscopy scan data.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 245, doi. 10.1046/j.1365-2818.2002.00992.x
- By:
- Publication type:
- Article
Works matching IS 00222720 AND DT 2002 AND VI 205 AND IP 3
Results: 13
1
2
Editorial.
- Published in:
- 2002
- By:
- Publication type:
- Editorial
3
Single-section plane assessment in grain boundary engineered brass.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 253, doi. 10.1046/j.1365-2818.2002.00989.x
- By:
- Publication type:
- Article
4
A preliminary electron backscattered diffraction study of sintered NdFeB-type magnets.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 270, doi. 10.1046/j.1365-2818.2002.00990.x
- By:
- Publication type:
- Article
5
Referees.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 216, doi. 10.1046/j.1365-2818.2002.01019.x
- Publication type:
- Article
6
Characterization of textured NiO films for application as buffer layers in high temperature superconducting tapes.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 231, doi. 10.1046/j.1365-2818.2002.00991.x
- By:
- Publication type:
- Article
7
Misorientation distributions in hot deformed NaCl using electron backscattered diffraction.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 285, doi. 10.1046/j.1365-2818.2002.00993.x
- By:
- Publication type:
- Article
8
Crystallographic orientation of ZrB<sub>2</sub> -ZrC composites manufactured by the spark plasma sintering method.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 238, doi. 10.1046/j.1365-2818.2002.00994.x
- By:
- Publication type:
- Article
9
Is fast mapping good mapping? A review of the benefits of high-speed orientation mapping using electron backscatter diffraction.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 259, doi. 10.1046/j.1365-2818.2002.00995.x
- By:
- Publication type:
- Article
10
Characterization of nitride thin films by electron backscatter diffraction.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 226, doi. 10.1046/j.1365-2818.2002.00996.x
- By:
- Publication type:
- Article
11
Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffraction.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 218, doi. 10.1046/j.1365-2818.2002.00997.x
- By:
- Publication type:
- Article
12
Application of electron backscatter diffraction (EBSD) to fracture studies of ferritic steels.
- Published in:
- Journal of Microscopy, 2002, v. 205, n. 3, p. 278, doi. 10.1046/j.1365-2818.2002.00998.x
- By:
- Publication type:
- Article
13
Table of Contents.
- Published in:
- 2002
- Publication type:
- Table of Contents