Works matching IS 00222720 AND DT 2001 AND VI 203 AND IP 3
Results: 12
Thickness measurements of lacey carbon films.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 326, doi. 10.1046/j.1365-2818.2001.00930.x
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A simple technique to measure the movements of the microscope stage along the x and y axes for sterological methods.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 321, doi. 10.1046/j.1365-2818.2001.00931.x
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Estimating the number of complex particles using the ConnEulor principle.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 314, doi. 10.1046/j.1365-2818.2001.00933.x
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On the analysis of spatial binary images.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 303, doi. 10.1046/j.1365-2818.2001.00899.x
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Structural analyses in three-dimensional atom probe: a Fourier transform approach.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 295, doi. 10.1046/j.1365-2818.2001.00923.x
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A new approach for cryofixation by high-pressure freezing.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 285, doi. 10.1046/j.1365-2818.2001.00919.x
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Assessment of chloride secretion in human nasal epithelial cells by X-ray microanalysis.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 277, doi. 10.1046/j.1365-2818.2001.00924.x
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Peculiarities of imaging one- and two-dimensional structures using an electron microscope in the mirror operation mode.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 269, doi. 10.1046/j.1365-2818.2001.00895.x
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GELFISH--Graphical environment for labelling fluorescence in-situ hybridization images.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 258, doi. 10.1046/j.1365-2818.2001.00893.x
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Time-domain whole-field fluorescence lifetime imaging with optical sectioning.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 246, doi. 10.1046/j.1365-2818.2001.00894.x
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Higher-order Laue zone line contrast in large-angle convergent-beam electron diffraction around a dislocation.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 239, doi. 10.1046/j.1365-2818.2001.00938.x
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A simple method for orienting silk and other flexible fibres in transmission electron microscopy specimens.
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- Journal of Microscopy, 2001, v. 203, n. 3, p. 235, doi. 10.1046/j.1365-2818.2001.00947.x
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