Works matching IS 00222720 AND DT 2001 AND VI 203 AND IP 1

Results: 17

In situ observation of oxygen deficiency occurring during electron irradiation in high Tc superconductor YBa2Cu3Oy.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 2, doi. 10.1046/j.1365-2818.2001.00842.x

By:

Akase, Z.;
Tomokiyo, Y.;
Watanabe, M.

Publication type:

Article

In situ observation and interferometric characterization of solid–liquid interface morphology in directionally growing transparent model systems.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 119, doi. 10.1046/j.1365-2818.2001.00900.x

By:

Jamgotchian, H.;
Bergeon, N.;
Benielli, D.;
Voge, P.;
Billia, B.

Publication type:

Article

Dislocation mobility and electronic effects in semiconductor compounds.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 72, doi. 10.1046/j.1365-2818.2001.00901.x

By:

Vanderschaeve, G.;
Levade, C.;
Caillard, D.

Publication type:

Article

In situ observation of the initial growth process of carbon nanotubes by time-resolved high resolution transmission electron microscopy.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 40, doi. 10.1046/j.1365-2818.2001.00902.x

By:

Watanabe, H.;
Hisada, Y.;
Mukainakano, S.;
Tanaka, N.

Publication type:

Article

Atomic force microscopy observations of in situ deformed materials: application to single crystals and thin films on substrates.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 99, doi. 10.1046/j.1365-2818.2001.00903.x

By:

Coupeau, C.;
Grilhé, J.

Publication type:

Article

In situ optical microscopic recording of slip line development during plastic deformation of Cu–15at%Al single crystals with high resolution – estimation of dislocation velocities.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 108, doi. 10.1046/j.1365-2818.2001.00904.x

By:

Hoffmann, U.;
Hampel, A.;
Neuhäuser, H.

Publication type:

Article

In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 17, doi. 10.1046/j.1365-2818.2001.00905.x

By:

Tsukimoto, S.;
Arai, S.;
Konno, M.;
Kamino, T.;
Sasaki, K.;
Saka, H.

Publication type:

Article

In situ transmission electron microscopy studies and real-time digital imaging.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 128, doi. 10.1046/j.1365-2818.2001.00907.x

By:

Alani, R.;
Pan, M.

Publication type:

Article

High-voltage electron microscope high-temperature in situ straining experiments to study dislocation dynamics in intermetallics and quasicrystals.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 68, doi. 10.1046/j.1365-2818.2001.00908.x

By:

Messerschmidt, U.

Publication type:

Article

In situ observation of superdislocation motion in pre-strained Ni3Ge single crystals.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 57, doi. 10.1046/j.1365-2818.2001.00910.x

By:

Murakumo, T.;
Haruta, K.;
Yoneyama, N.;
Sato, A.

Publication type:

Article

Dynamic chemical mapping near a Si/SiO2 interface at elevated temperatures using plasmon-loss images.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 12, doi. 10.1046/j.1365-2818.2001.00911.x

By:

Sasaki, K.;
Tsukimoto, S.;
Konno, M.;
Kamino, T.;
Saka, H.

Publication type:

Article

Direct observation of a Ti/Cu interface with atomic displacement under electron irradiation.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 34, doi. 10.1046/j.1365-2818.2001.00912.x

By:

Ohta, S.;
Sakaguchi, N.;
Shibayama, T.;
Takahashi, H.

Publication type:

Article

Precursor effects of martensitic transformations in Ti-based alloys studied by electron microscopy with energy filtering.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 22, doi. 10.1046/j.1365-2818.2001.00913.x

By:

Murakami, Y.;
Shibuya, H.;
Shindo, D.

Publication type:

Article

In situ observations of unusual dislocation mechanisms in the intermetallic alloy Ti3Al.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 90, doi. 10.1046/j.1365-2818.2001.00914.x

By:

Legros, M.;
Caillard, D.

Publication type:

Article

Quantitative measurements in in situ straining experiments in transmission electron microscopy.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 47, doi. 10.1046/j.1365-2818.2001.00916.x

By:

Pettinari, F.;
Couret, A.;
Caillard, D.;
Molénat, G.;
Clément, N.;
Coujou, A.

Publication type:

Article

Editorial.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 1, doi. 10.1046/j.1365-2818.2001.00927.x

By:

Saka, H.;
Caillard, D.

Publication type:

Article

Is plastic flow always controlled by dislocation mobility? An answer from in situ transmission electron microscopy straining tests.

Published in:

Journal of Microscopy, 2001, v. 203, n. 1, p. 84, doi. 10.1046/j.1365-2818.2001.00915.x

By:

Louchet, F.;
Doisneau-Cottignies, B.;
Calonne, O.;
Fraczkiewicz, A.;
Janecek, M.;
Guelton, N.

Publication type:

Article

Works matching IS 00222720 AND DT 2001 AND VI 203 AND IP 1

In situ observation of oxygen deficiency occurring during electron irradiation in high T<sub>c</sub> superconductor YBa<sub>2</sub>Cu<sub>3</sub>O<sub>y</sub>.

In situ observation and interferometric characterization of solid–liquid interface morphology in directionally growing transparent model systems.

Dislocation mobility and electronic effects in semiconductor compounds.

In situ observation of the initial growth process of carbon nanotubes by time-resolved high resolution transmission electron microscopy.

Atomic force microscopy observations of in situ deformed materials: application to single crystals and thin films on substrates.

In situ optical microscopic recording of slip line development during plastic deformation of Cu–15at%Al single crystals with high resolution – estimation of dislocation velocities.

In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al.

In situ transmission electron microscopy studies and real-time digital imaging.

High-voltage electron microscope high-temperature in situ straining experiments to study dislocation dynamics in intermetallics and quasicrystals.

In situ observation of superdislocation motion in pre-strained Ni<sub>3</sub>Ge single crystals.

Dynamic chemical mapping near a Si/SiO<sub>2</sub> interface at elevated temperatures using plasmon-loss images.

Direct observation of a Ti/Cu interface with atomic displacement under electron irradiation.

Precursor effects of martensitic transformations in Ti-based alloys studied by electron microscopy with energy filtering.

In situ observations of unusual dislocation mechanisms in the intermetallic alloy Ti<sub>3</sub>Al.

Quantitative measurements in in situ straining experiments in transmission electron microscopy.

Editorial.

Is plastic flow always controlled by dislocation mobility? An answer from in situ transmission electron microscopy straining tests.