Works matching IS 00222720 AND DT 1999 AND VI 195 AND IP 3

Results: 10

A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methods.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 186, doi. 10.1046/j.1365-2818.1999.00571.x

By:

DAY;
QUESTED;
Day

Publication type:

Article

Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 217, doi. 10.1046/j.1365-2818.1999.00572.x

By:

PRIOR

Publication type:

Article

Influence of grain orientations on the initiation of fatigue damage in an Al–Li alloy.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 239, doi. 10.1046/j.1365-2818.1999.00573.x

By:

TAYLOR;
ZHAI;
WILKINSON;
MARTIN;
Wilkinson

Publication type:

Article

Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 197, doi. 10.1046/j.1365-2818.1999.00574.x

By:

AHMED;
WILKINSON;
ROBERTS;
WILKINSON

Publication type:

Article

Crystallographic analysis of facets using electron backscatter diffraction.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 226, doi. 10.1046/j.1365-2818.1999.00577.x

By:

RANDLE;
Randle

Publication type:

Article

Quantitative metallography by electron backscattered diffraction.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 170, doi. 10.1046/j.1365-2818.1999.00578.x

By:

HUMPHREYS;
HUMPHREYS

Publication type:

Article

Source point calibration from an arbitrary electron backscattering pattern.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 204, doi. 10.1046/j.1365-2818.1999.00581.x

By:

KRIEGER LASSEN;
KRIEGER LASSEN

Publication type:

Article

Electron backscatter diffraction: applications for nuclear materials.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 233, doi. 10.1046/j.1365-2818.1999.00580.x

By:

MEDEVIELLE;
HUGON;
DUGNE;
Hugon, Isabelle

Publication type:

Article

Introduction.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 169, doi. 10.1046/j.1365-2818.1999.00626.x

By:

Wilkinson, Angus J.

Publication type:

Article

Electron backscatter diffraction of grain and subgrain structures — resolution considerations.

Published in:

Journal of Microscopy, 1999, v. 195, n. 3, p. 212, doi. 10.1046/j.1365-2818.1999.00579.x

By:

HUMPHREYS;
HUANG;
BROUGH;
HARRIS;
Humphreys

Publication type:

Article