Works matching IS 00222720 AND DT 1999 AND VI 195 AND IP 1
Results: 10
Stereological estimation using vertical sections in a complex tissue.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 79, doi. 10.1046/j.1365-2818.1999.00471.x
- By:
- Publication type:
- Article
Three-dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 23, doi. 10.1046/j.1365-2818.1999.00478.x
- By:
- Publication type:
- Article
Quantitative electron spectroscopic diffraction analyses of the crystal formation in dentine.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 58, doi. 10.1046/j.1365-2818.1999.00479.x
- By:
- Publication type:
- Article
The effect of large solid angles of collection on quantitative X-ray microanalysis in the AEM.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 34, doi. 10.1046/j.1365-2818.1999.00481.x
- By:
- Publication type:
- Article
A method for characterizing longitudinal chromatic aberration of microscope objectives using a confocal optical system.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 17, doi. 10.1046/j.1365-2818.1999.00488.x
- By:
- Publication type:
- Article
A comparative study of colloidal particles as imaging standards for microscopy.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 64, doi. 10.1046/j.1365-2818.1999.00490.x
- By:
- Publication type:
- Article
Influence of crystal orientation on oxygen analysis in NiO with energy dispersive X-ray analysis.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 1
- By:
- Publication type:
- Article
Crystal structure retrieval by maximum entropy analysis of atomic resolution incoherent images.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 44, doi. 10.1046/j.1365-2818.1999.00569.x
- By:
- Publication type:
- Article
High resolution electron backscatter diffraction with a field emission gun scanning electron microscope.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 6
- By:
- Publication type:
- Article
I[sup 5]M: 3D widefield light microscopy with better than 100 nm axial resolution.
- Published in:
- Journal of Microscopy, 1999, v. 195, n. 1, p. 10, doi. 10.1046/j.1365-2818.1999.00576.x
- By:
- Publication type:
- Article