The quantitative characterization of SiGe layers by analysing rocking profiles in CBED patterns.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 12, doi. 10.1046/j.1365-2818.1999.00454.x
- By:
- Publication type:
- Article
Works matching IS 00222720 AND DT 1999 AND VI 194 AND IP 1
Results: 23
1
2
Phase contrast of spherical magnetic particles.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 84, doi. 10.1111/jmi.1999.194.1.84
- By:
- Publication type:
- Article
3
A study of charge distribution in Bi[sub 2]Sr[sub 2]CaCu[sub 2]O[sub 8+δ] superconductors using novel electron-diffraction and imaging techniques.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 21, doi. 10.1046/j.1365-2818.1999.00445.x
- By:
- Publication type:
- Article
4
A new 200 kV Ω-filter electron microscope.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 219, doi. 10.1046/j.1365-2818.1999.00446.x
- By:
- Publication type:
- Article
5
Development of a high energy resolution electron energy-loss spectroscopy microscope.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 203, doi. 10.1046/j.1365-2818.1999.00450.x
- By:
- Publication type:
- Article
6
In-situ observation of shape and atomic structure of Xe nanocrystals embedded in aluminium.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 152, doi. 10.1046/j.1365-2818.1999.00451.x
- By:
- Publication type:
- Article
7
TEM characterization of self-organized CdSe/ZnSe quantum dots.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 183, doi. 10.1046/j.1365-2818.1999.00452.x
- By:
- Publication type:
- Article
8
Electronic structure analysis of (In, Ga, Al) N heterostructures on the nanometre scale using EELS.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 79, doi. 10.1046/j.1365-2818.1999.00453.x
- By:
- Publication type:
- Article
9
Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field images.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 171, doi. 10.1046/j.1365-2818.1999.00458.x
- By:
- Publication type:
- Article
10
Energy-filtered transmission electron microscopy of multilayers in semiconductors.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 58, doi. 10.1046/j.1365-2818.1999.00459.x
- By:
- Publication type:
- Article
11
High-precision assessment of interface lattice offset by quantitative HRTEM.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 142, doi. 10.1046/j.1365-2818.1999.00465.x
- By:
- Publication type:
- Article
12
Identification of intergranular phases in ceramic nanocomposites.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 192, doi. 10.1046/j.1365-2818.1999.00466.x
- By:
- Publication type:
- Article
13
A simple channelling model for HREM contrast transfer under dynamical conditions.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 112, doi. 10.1046/j.1365-2818.1999.00467.x
- By:
- Publication type:
- Article
14
Energy filtering transmission electron microscopy using the new JEM-2010FEF.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 210, doi. 10.1046/j.1365-2818.1999.00468.x
- By:
- Publication type:
- Article
15
Element specific imaging with high lateral resolution: an experimental study on layer structures.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 42, doi. 10.1046/j.1365-2818.1999.00469.x
- By:
- Publication type:
- Article
16
Relativistic calculations of intensity distributions in elemental maps using contrast transfer functions.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 30, doi. 10.1046/j.1365-2818.1999.00470.x
- By:
- Publication type:
- Article
17
Defect formation in self-assembling quantum dots of InGaAs on GaAs: a case study of direct measurements of local strain from HREM.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 161, doi. 10.1046/j.1365-2818.1999.00472.x
- By:
- Publication type:
- Article
18
How to optimize the design of a quantitative HREM experiment so as to attain the highest precision.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 95, doi. 10.1046/j.1365-2818.1999.00473.x
- By:
- Publication type:
- Article
19
The influence of atomic vibrations on the imaging properties of atomic focusers.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 105, doi. 10.1046/j.1365-2818.1999.00474.x
- By:
- Publication type:
- Article
20
Using the Hough transform for HOLZ line identification in convergent beam electron diffraction.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 02, doi. 10.1046/j.1365-2818.1999.00475.x
- By:
- Publication type:
- Article
21
Quantitative electron spectroscopic imaging studies of microelectronic metallization layers.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 71, doi. 10.1046/j.1365-2818.1999.00476.x
- By:
- Publication type:
- Article
22
Direct versus iterative structure retrieval for a Cu/Ti misfit dislocation: a comparison of various 1Å HREM technologies.
- Published in:
- Journal of Microscopy, 1999, v. 194, n. 1, p. 124, doi. 10.1046/j.1365-2818.1999.00477.x
- By:
- Publication type:
- Article
23
Editorial.
- Published in:
- 1999
- By:
- Publication type:
- Editorial