Works matching IS 00222720 AND DT 1999 AND VI 193 AND IP 2
1
- Journal of Microscopy, 1999, v. 193, n. 2, p. 142, doi. 10.1046/j.1365-2818.1999.00424.x
- VELINOV, T. S.;
- SEE, C. W.;
- SOMEKH, M. G.;
- SCHUMACHER, K. L.
- Article
2
- Journal of Microscopy, 1999, v. 193, n. 2, p. 109, doi. 10.1046/j.1365-2818.1999.00418.x
- Article
3
- Journal of Microscopy, 1999, v. 193, n. 2, p. 171, doi. 10.1046/j.1365-2818.1999.00426.x
- Bitler, A.;
- Barbul, A.;
- Korenstein, R.;
- Korenstein, Rafi
- Article
4
- Journal of Microscopy, 1999, v. 193, n. 2, p. 158, doi. 10.1046/j.1365-2818.1999.00430.x
- Jongebloed;
- Stokroos;
- van der Want;
- Kalicharan;
- Jongebloed
- Article
5
- Journal of Microscopy, 1999, v. 193, n. 2, p. 100, doi. 10.1046/j.1365-2818.1999.00440.x
- Article
6
- Journal of Microscopy, 1999, v. 193, n. 2, p. 150, doi. 10.1046/j.1365-2818.1999.00441.x
- ŠAMAJ;
- ENSIKAT;
- BALUŠKA;
- KNOX;
- BARTHLOTT;
- VOLKMANN;
- Šamaj
- Article
7
- Journal of Microscopy, 1999, v. 193, n. 2, p. 127, doi. 10.1046/j.1365-2818.1999.00448.x
- HIGDON;
- TÖRÖK;
- WILSON;
- Török
- Article
8
- Journal of Microscopy, 1999, v. 193, n. 2, p. 105, doi. 10.1046/j.1365-2818.1999.00449.x
- O'DONNELL;
- TOBIN;
- BAYLISS;
- VAN DER STRICHT;
- O’Donnell.
- Article
9
- Journal of Microscopy, 1999, v. 193, n. 2, p. 97, doi. 10.1046/j.1365-2818.1999.00439.x
- Article