Exit wave reconstruction using a conventional transmission electron microscope.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 281, doi. 10.1046/j.1365-2818.1998.2790834.x
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- Article
Works matching IS 00222720 AND DT 1998 AND VI 190 AND IP 1/2
Results: 27
1
2
Towards 1.0 A resolution: taking advantage of dynamical scattering, and the benefits for....
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 267, doi. 10.1046/j.1365-2818.1998.3020851.x
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- Article
3
Inversion of nonperiodic wavefields to determine localized defect structure.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 262, doi. 10.1046/j.1365-2818.1998.3010847.x
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- Article
4
Crystallographic image processing approach to crystal structure determination.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 249, doi. 10.1046/j.1365-2818.1998.2980849.x
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- Article
5
Retrieval of object information by inverse problems in electron diffraction.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 238, doi. 10.1046/j.1365-2818.1998.2960853.x
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- Article
6
Accurate structure determinations of very small (4--20nm) areas, using refinement of dynamic....
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 222, doi. 10.1046/j.1365-2818.1998.3270880.x
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7
Crystal structure determination by direct inversion of dynamical microdiffraction patterns.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 214, doi. 10.1046/j.1365-2818.1998.3240875.x
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- Article
8
The effect of three-fold astigmatism on measurement of grain boundary volume expansion by....
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 204, doi. 10.1046/j.1365-2818.1998.2890841.x
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9
Detection and quantitative assessment of image aberrations from single HRTEM lattice images.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 194, doi. 10.1046/j.1365-2818.1998.3000848.x
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10
Quantitative atomic structure determination from HREM: viewpoints on accuracy and reliability.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 190, doi. 10.1046/j.1365-2818.1998.3370885.x
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- Article
11
Sensitivity limits of strain mapping procedures using high-resolution electron microscopy.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 184, doi. 10.1046/j.1365-2818.1998.3100866.x
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- Article
12
Composition mapping at high resolution.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 171, doi. 10.1046/j.1365-2818.1998.3400882.x
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- Article
13
Accurate structure determination from image reconstruction in ADF STEM.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 159, doi. 10.1046/j.1365-2818.1998.3260881.x
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14
Reliability of atom column positions in a ternary system determined by quantitative....
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 144, doi. 10.1046/j.1365-2818.1998.3090862.x
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- Article
15
Quantitative HREM observation of the sum11(113)/[i10] grain-boundary structure in aluminum and....
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 131, doi. 10.1046/j.1365-2818.1998.3320899.x
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- Article
16
Iterative structure retrieval techniques in HREM: a comparative study and a modular program package.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 109, doi. 10.1046/j.1365-2818.1998.3120865.x
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17
Why don't high-resolution simulations and images match?
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 99, doi. 10.1046/j.1365-2818.1998.2910843.x
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18
Ab-initio HRTEM simulations of ionic crystals: a case study of sapphire.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 89, doi. 10.1046/j.1365-2818.1998.3110863.x
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19
A coherence function approach to image simulation.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 73, doi. 10.1046/j.1365-2818.1998.3050868.x
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20
Fuzzy logic approaches to the analysis of HREM images of III--V compounds.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 61, doi. 10.1046/j.1365-2818.1998.2830831.x
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21
Quantitative comparison of images and transforms.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 52, doi. 10.1046/j.1365-2818.1998.3380884.x
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22
Optimal and near-optimal filters in high-resolution electron microscopy.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 45, doi. 10.1046/j.1365-2818.1998.3070861.x
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- Publication type:
- Article
23
The evolution of electron image processing and its potential debt to image algebra.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 37, doi. 10.1046/j.1365-2818.1998.3060860.x
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- Article
24
Probabilistic data analysis: an introductory guide.
- Published in:
- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 28, doi. 10.1046/j.1365-2818.1998.2780835.x
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- Article
25
Probability estimations for fitted parameters -- the EXPHER package.
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 19, doi. 10.1046/j.1365-2818.1998.3080867.x
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26
Multivariate statistical methods for the analysis of microscope image series: applications in....
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- Journal of Microscopy, 1998, v. 190, n. 1/2, p. 2, doi. 10.1046/j.1365-2818.1998.3250876.x
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27
Editorial.
- Published in:
- 1998
- By:
- Publication type:
- Editorial