Works matching IS 00222720 AND DT 1995 AND VI 180 AND IP 3
Results: 17
Volume fraction measurement of dispersoids in a thin foil by parallel energy-loss spectroscopy: development and assessment of the technique.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 217, doi. 10.1111/j.1365-2818.1995.tb03681.x
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X-Ray Spectrometry in Electron Beam Instruments. Edited by D. B. Williams J. I. Goldstein and D. E. Newbury.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 326, doi. 10.1111/j.1365-2818.1995.tb03692.x
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Energy-filtered Fresnel contrast analysis of Fe/Cu multilayers.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 263, doi. 10.1111/j.1365-2818.1995.tb03685.x
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Recent developments in secondary electron imaging.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 192, doi. 10.1111/j.1365-2818.1995.tb03678.x
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Segregation-induced hole drilling at grain boundaries.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 300, doi. 10.1111/j.1365-2818.1995.tb03689.x
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Quantification of the EELS near-edge structures to study Mn doping in oxides.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 211, doi. 10.1111/j.1365-2818.1995.tb03680.x
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Observations of changing fine structure in nanoscale EELS analysis of grain boundaries in stainless steels.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 313, doi. 10.1111/j.1365-2818.1995.tb03691.x
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The electron energy-loss near-edge structure (ELNES) on the N K-edges from the transition metal mononitrides with the rock-salt structure and its comparison with that on the C K-edges from the corresponding transition metal monocarbides.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 250, doi. 10.1111/j.1365-2818.1995.tb03684.x
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Introduction.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 191, doi. 10.1111/j.1365-2818.1995.tb03677.x
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Energy losses in colloidal metals.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 294, doi. 10.1111/j.1365-2818.1995.tb03688.x
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Oxygen K near-edge spectra of amorphous silicon suboxides.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 307, doi. 10.1111/j.1365-2818.1995.tb03690.x
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- Article
Probing the local structure and bonding at interfaces and defects using EELS in the TEM.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 238, doi. 10.1111/j.1365-2818.1995.tb03683.x
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- Article
Changes in the iron white-line ratio in the electron energy-loss spectrum of iron-copper multilayers.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 288, doi. 10.1111/j.1365-2818.1995.tb03687.x
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Atomic-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 230, doi. 10.1111/j.1365-2818.1995.tb03682.x
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Erratum.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 327, doi. 10.1111/j.1365-2818.1995.tb03693.x
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- Article
Spatial resolution in EFTEM elemental maps.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 277, doi. 10.1111/j.1365-2818.1995.tb03686.x
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Near-atomic-resolution EELS in silicon-germanium alloys.
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- Journal of Microscopy, 1995, v. 180, n. 3, p. 204, doi. 10.1111/j.1365-2818.1995.tb03679.x
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- Article