Works matching IS 00222720 AND DT 1995 AND VI 179 AND IP 2
Results: 18
The development of coherent Foucault imaging to investigate magnetic microstructure.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 119, doi. 10.1111/j.1365-2818.1995.tb03621.x
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- Article
Use of the quasi-classical approximation for projected potential calculation in HREM image simulation.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 191, doi. 10.1111/j.1365-2818.1995.tb03632.x
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- Article
The immutability of the laws of electron optics.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 143, doi. 10.1111/j.1365-2818.1995.tb03625.x
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- Article
A lifetime in electron optics: a biographical sketch of Tom Mulvey with a bibliography.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 97, doi. 10.1111/j.1365-2818.1995.tb03618.x
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- Article
Second-order finite element method and its practical application in charged particle optics.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 170, doi. 10.1111/j.1365-2818.1995.tb03629.x
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- Article
Holographic measurement of the wave aberration of an electron microscope by means of the phases in the Fourier spectrum.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 112, doi. 10.1111/j.1365-2818.1995.tb03620.x
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- Article
Unconventional lens computation.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 185, doi. 10.1111/j.1365-2818.1995.tb03631.x
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- Article
Studies on condenser-objective lenses.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 137, doi. 10.1111/j.1365-2818.1995.tb03624.x
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Editorial.
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- 1995
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- Editorial
High-order and multipole aberrations by aberration integral and direct ray-tracing methods.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 161, doi. 10.1111/j.1365-2818.1995.tb03628.x
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- Article
The advantages of using linear and non-linear second-order finite element methods in electron lens design.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 181, doi. 10.1111/j.1365-2818.1995.tb03630.x
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- Article
New parameters in iron-free magnetic lens aberrations.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 133, doi. 10.1111/j.1365-2818.1995.tb03623.x
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- Article
HREM structure characterization of interfaces in semiconducting multi-layers using molecular-dynamics-supported image interpretation.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 214, doi. 10.1111/j.1365-2818.1995.tb03634.x
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- Article
On the calculation of magnetic fields generated by coils.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 158, doi. 10.1111/j.1365-2818.1995.tb03627.x
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- Article
Miniature magnetic electron lenses with permanent magnets.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 129, doi. 10.1111/j.1365-2818.1995.tb03622.x
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- Article
Observation of lens aberrations for very high-resolution electron microscopy. I. Theory.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 201, doi. 10.1111/j.1365-2818.1995.tb03633.x
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- Article
Approximate expressions for electron lens properties.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 145, doi. 10.1111/j.1365-2818.1995.tb03626.x
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- Article
Past, present and future of electron holography.
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- Journal of Microscopy, 1995, v. 179, n. 2, p. 105, doi. 10.1111/j.1365-2818.1995.tb03619.x
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- Article