Works matching IS 00222720 AND DT 1995 AND VI 178 AND IP 3
Results: 11
Evaluation of triple-band filters for quantitative epifluorescence microscopy.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 240, doi. 10.1111/j.1365-2818.1995.tb03601.x
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- Article
Propagation function: constant time algorithms.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 272, doi. 10.1111/j.1365-2818.1995.tb03605.x
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- Article
Holography of holes, with electrons and photons.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 191, doi. 10.1111/j.1365-2818.1995.tb03597.x
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- Article
The secondary fluorescence correction for X-ray microanalysis in the analytical electron microscope.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 226, doi. 10.1111/j.1365-2818.1995.tb03600.x
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- Article
The three-dimensional point spread functions of a microscope objective in image and object space.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 267, doi. 10.1111/j.1365-2818.1995.tb03604.x
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- Article
A new confocal scanning beam laser MACROscope using a telecentric, f-theta laser scan lens.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 261, doi. 10.1111/j.1365-2818.1995.tb03603.x
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- Article
Vacuum Methods in Electron Microscopy. By Wilbur C. Bigelow.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 286, doi. 10.1111/j.1365-2818.1995.tb03607.x
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- Article
Use of light and scanning electron microscope techniques to monitor microstructural changes in aluminium-based metal matrix composites.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 208, doi. 10.1111/j.1365-2818.1995.tb03599.x
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- Article
Analysis of the spatial distribution of AgNOR proteins in cell nuclei using simultaneous confocal scanning laser fluorescence and transmitted light microscopy.
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- Journal of Microscopy, 1995, v. 178, n. 3, p. 251, doi. 10.1111/j.1365-2818.1995.tb03602.x
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Improved specimen holders for the scanning electron microscopy of insects and other small objects.
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- 1995
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- Publication type:
- Other
Correction for the effects of elastic scattering in core-loss quantification.
- Published in:
- Journal of Microscopy, 1995, v. 178, n. 3, p. 198, doi. 10.1111/j.1365-2818.1995.tb03598.x
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- Article