Works matching IS 00222720 AND DT 1992 AND VI 168 AND IP 2

Results: 7

R.M.S. Microscopy Handbook No. 25: The Rôle of Microscopy in Semiconductor Failure Analysis. By B. P. R ichards and P. K. F ootner.

Published in:

Journal of Microscopy, 1992, v. 168, n. 2, p. 207, doi. 10.1111/j.1365-2818.1992.tb03262.x

By:

Goodhew, Peter

Publication type:

Article

Stereo pairs of bright-field micrographs via Wiener-type inverse filtering.

Published in:

Journal of Microscopy, 1992, v. 168, n. 2, p. 115, doi. 10.1111/j.1365-2818.1992.tb03256.x

By:

Khosla, Deepak;
Holmes, Timothy J.

Publication type:

Article

A simple way to encapsulate small samples for processing for TEM.

Published in:

1992

By:

Mariné, M. C. Hernández

Publication type:

Other

A Monte Carlo code to simulate the effect of fast secondary electrons on κ<sub>AB</sub> factors and spatial resolution in the TEM.

Published in:

Journal of Microscopy, 1992, v. 168, n. 2, p. 153, doi. 10.1111/j.1365-2818.1992.tb03258.x

By:

Gauvin, Raynald;
L'Espérance, Gilles

Publication type:

Article

Artefacts and morphological changes during chemical fixation.

Published in:

Journal of Microscopy, 1992, v. 168, n. 2, p. 181, doi. 10.1111/j.1365-2818.1992.tb03260.x

By:

Kellenberger, Eduard;
Johansen, Renata;
Maeder, Marlies;
Bohrmann, Bernd;
Stauffer, Esther;
Villiger, Werner

Publication type:

Article

Depth discrimination in scanned heterodyne microscope systems.

Published in:

Journal of Microscopy, 1992, v. 168, n. 2, p. 131, doi. 10.1111/j.1365-2818.1992.tb03257.x

By:

Somekh, Michael G.

Publication type:

Article

High-resolution scanning electron microscopy of frozen-hydrated cells.

Published in:

Journal of Microscopy, 1992, v. 168, n. 2, p. 169, doi. 10.1111/j.1365-2818.1992.tb03259.x

By:

Walther, Paul;
Chen, Ya;
Pech, Louis L.;
Pawley, James B.

Publication type:

Article