Works matching IS 00222720 AND DT 1992 AND VI 168 AND IP 2
Results: 7
R.M.S. Microscopy Handbook No. 25: The Rôle of Microscopy in Semiconductor Failure Analysis. By B. P. R ichards and P. K. F ootner.
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- Journal of Microscopy, 1992, v. 168, n. 2, p. 207, doi. 10.1111/j.1365-2818.1992.tb03262.x
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- Article
High-resolution scanning electron microscopy of frozen-hydrated cells.
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- Journal of Microscopy, 1992, v. 168, n. 2, p. 169, doi. 10.1111/j.1365-2818.1992.tb03259.x
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A simple way to encapsulate small samples for processing for TEM.
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- 1992
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- Other
A Monte Carlo code to simulate the effect of fast secondary electrons on κ<sub>AB</sub> factors and spatial resolution in the TEM.
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- Journal of Microscopy, 1992, v. 168, n. 2, p. 153, doi. 10.1111/j.1365-2818.1992.tb03258.x
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- Article
Artefacts and morphological changes during chemical fixation.
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- Journal of Microscopy, 1992, v. 168, n. 2, p. 181, doi. 10.1111/j.1365-2818.1992.tb03260.x
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- Article
Depth discrimination in scanned heterodyne microscope systems.
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- Journal of Microscopy, 1992, v. 168, n. 2, p. 131, doi. 10.1111/j.1365-2818.1992.tb03257.x
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- Article
Stereo pairs of bright-field micrographs via Wiener-type inverse filtering.
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- Journal of Microscopy, 1992, v. 168, n. 2, p. 115, doi. 10.1111/j.1365-2818.1992.tb03256.x
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- Article