Works matching IS 00222720 AND DT 1991 AND VI 163 AND IP 3
Results: 9
Determination of the C<sub>nl</sub> parameter in the Bethe formula for the ionization cross-section by the use of Cliff-Lorimer K<sub>AB</sub> factors obtained at different accelerating voltages in a TEM.
- Published in:
- Journal of Microscopy, 1991, v. 163, n. 3, p. 295, doi. 10.1111/j.1365-2818.1991.tb03181.x
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- Article
Book Reviews.
- Published in:
- Journal of Microscopy, 1991, v. 163, n. 3, p. 347, doi. 10.1111/j.1365-2818.1991.tb03185.x
- Publication type:
- Article
Reflection electron imaging and spectroscopy studies of aluminium metal reduction at α-aluminium oxide (0,1,2) surfaces.
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- Journal of Microscopy, 1991, v. 163, n. 3, p. 261, doi. 10.1111/j.1365-2818.1991.tb03178.x
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- Article
Images of 16S ribosomal RNA by scanning tunnelling microscopy.
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- Journal of Microscopy, 1991, v. 163, n. 3, p. 287, doi. 10.1111/j.1365-2818.1991.tb03180.x
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- Article
A modified Jelley refractometer.
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- Journal of Microscopy, 1991, v. 163, n. 3, p. 333, doi. 10.1111/j.1365-2818.1991.tb03184.x
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- Article
Validation of convection-limited cooling of samples for freeze-fracture electron microscopy.
- Published in:
- Journal of Microscopy, 1991, v. 163, n. 3, p. 307, doi. 10.1111/j.1365-2818.1991.tb03182.x
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- Article
Electron microscopic study of the atomic structure of OMVPE-grown GaInAs/InP quantum wells.
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- Journal of Microscopy, 1991, v. 163, n. 3, p. 275, doi. 10.1111/j.1365-2818.1991.tb03179.x
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- Publication type:
- Article
SEM electron channelling patterns as a technique for the characterization of ion-implantation damage.
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- Journal of Microscopy, 1991, v. 163, n. 3, p. 245, doi. 10.1111/j.1365-2818.1991.tb03177.x
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- Article
In defence of aldehyde-osmium fixation and critical-point drying for characterization of seed-storage fungi by scanning electron microscopy.
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- Journal of Microscopy, 1991, v. 163, n. 3, p. 321, doi. 10.1111/j.1365-2818.1991.tb03183.x
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- Article