Works matching IS 00222720 AND DT 1989 AND VI 154 AND IP 3


Results: 12
    1
    2
    3
    4
    5
    6
    7
    8
    9
    10
    11

    Materials analysis with a position-sensitive atom probe.

    Published in:
    Journal of Microscopy, 1989, v. 154, n. 3, p. 215, doi. 10.1111/j.1365-2818.1989.tb00584.x
    By:
    • Cerezo, A.;
    • Godfrey, T. J.;
    • Grovenor, C. R. M.;
    • Hetherington, M. G.;
    • Hoyley, R. M.;
    • Jakubovics, J. P.;
    • Liddle, J. A.;
    • Smith, G. D. W.;
    • Worrall, G. M.
    Publication type:
    Article
    12