Works matching IS 00222720 AND DT 1988 AND VI 152 AND IP 2

Results: 35

Donor graphite intercalation compounds studied with a high stability STM.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 509, doi. 10.1111/j.1365-2818.1988.tb01414.x

By:

Anselmetti, D.;
Wiesendanger, R.;
Geiser, V.;
Hidber, H. R.;
Güntherodt, H.-J.

Publication type:

Article

Image Analysis and Mathematical Morphology. Volume 2: Theoretical Advances. Edited by J ean S erra.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 597, doi. 10.1111/j.1365-2818.1988.tb01425.x

By:

Nagel, Werner

Publication type:

Article

The STM learning curve and where it may take us.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 299, doi. 10.1111/j.1365-2818.1988.tb01391.x

By:

Demuth, J. E.;
Koehler, U.;
Hamers, R. J.

Publication type:

Article

Study of Au surfaces by scanning tunnelling microscopy.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 449, doi. 10.1111/j.1365-2818.1988.tb01407.x

By:

Kuk, Y.;
Silverman, P. J.;
Chua, F. M.

Publication type:

Article

In situ, atomic scale observation of electrode topography and reactions.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 537, doi. 10.1111/j.1365-2818.1988.tb01418.x

By:

Twomey, T.;
Wiechers, J.;
Kolb, D.M.;
Behm, R. J.

Publication type:

Article

A role of a tip geometry on STM images.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 347, doi. 10.1111/j.1365-2818.1988.tb01395.x

By:

Hashizume, T.;
Kamiya, I.;
Hasegawa, Y.;
Sano, N.;
Sakurai, T.;
Pickering, H. W.

Publication type:

Article

Finite element analysis of PZT tube scanner motion for scanning tunnelling microscopy.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 379, doi. 10.1111/j.1365-2818.1988.tb01399.x

By:

Carr, R. G.

Publication type:

Article

STM of layered-structure semiconductors.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 467, doi. 10.1111/j.1365-2818.1988.tb01409.x

By:

Henson, Tammy D.;
Sarid, Dror;
Bell, L. Stephen

Publication type:

Article

Measurements of polyphosphoric acid on HOPG.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 547, doi. 10.1111/j.1365-2818.1988.tb01420.x

By:

Mizutani, Wataru;
Shigeno, Masatsugu;
Saito, Kazuhiro;
Morita, Naotake;
Yoshioka, Toru;
Ono, Masatoshi;
Kajimura, Koji

Publication type:

Article

Scanning tunnelling microscopy of 1-D and 2-D charge-density wave systems.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 497, doi. 10.1111/j.1365-2818.1988.tb01413.x

By:

Gammie, G.;
Skala, S.;
Hubacek, J. S.;
Brockenbrough, R.;
Lyons, W. G.;
Tucker, J. R.;
Lyding, J. W.

Publication type:

Article

Scanning tunnelling engineering.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 585, doi. 10.1111/j.1365-2818.1988.tb01424.x

By:

Schneiker, Conrad;
Hameroff, Stuart;
Voelker, Mark;
He, Jackson;
Dereniak, Eustace;
McCuskey, Robert

Publication type:

Article

Scanning tunnelling microscopy and spectroscopy on Cu(111) and Au(111).

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 441, doi. 10.1111/j.1365-2818.1988.tb01406.x

By:

Brodde, A.;
Tosch, St.;
Neddermeyer, H.

Publication type:

Article

Investigation of Bloch wall fine structures by magnetic force microscopy.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 527, doi. 10.1111/j.1365-2818.1988.tb01417.x

By:

Göddenhenrich, T.;
Hartmann, U.;
Anders, M.;
Heiden, C.

Publication type:

Article

Surface structures of YBa2Cu3O7-x, BiCa1·7Sr0·7Cu2Ox and TlCaBaCuO4·5±x investigated by scanning tunnelling microscopy.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 407, doi. 10.1111/j.1365-2818.1988.tb01402.x

By:

Laiho, R.;
Aarnio, M.;
Heikkilä, L.;
Snellman, H.;
Kirschner, I.;
Halász, I.

Publication type:

Article

A frictional force microscope controlled with an electromagnet.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 363, doi. 10.1111/j.1365-2818.1988.tb01397.x

By:

Kaneko, R.

Publication type:

Article

STM study of the effects of pulsed laser irradiation on semiconductor surfaces.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 337, doi. 10.1111/j.1365-2818.1988.tb01394.x

By:

Tomitori, Masahiko;
Katsuki, Futoshi;
Nishikawa, Osamu

Publication type:

Article

Clean and metal-contaminated Si(110) surfaces studied by RHEED, XPS and STM.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 487, doi. 10.1111/j.1365-2818.1988.tb01412.x

By:

Loenen, E. J.;
Dijkkamp, D.;
Hoeven, A. J.

Publication type:

Article

Polymers on graphite and gold: molecular images and substrate defects.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 573, doi. 10.1111/j.1365-2818.1988.tb01423.x

By:

Rabe, J. P.;
Sano, M.;
Batchelder, D.;
Kalatchev, A. A.

Publication type:

Article

STM study of the structure of the sulphur (1×2) overlayer on molybdenum (001) in air: ordered domains, phase boundaries and defects.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 427, doi. 10.1111/j.1365-2818.1988.tb01405.x

By:

Marchon, B.;
Ogletree, D. F.;
Bussell, M. E.;
Somorjai, G. A.;
Salmeron, M.;
Siekhaus, W.

Publication type:

Article

Design and operation of a variable temperature scanning tunnelling microscope.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 371, doi. 10.1111/j.1365-2818.1988.tb01398.x

By:

Lyding, J.W.;
Skala, S.;
Hubacek, J.S.;
Brockenbrough, R.;
Gammie, G.

Publication type:

Article

STM and AFM investigations of high- Tc superconductors.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 399, doi. 10.1111/j.1365-2818.1988.tb01401.x

By:

Heinzelmann, H.;
Anselmetti, D.;
Wiesendanger, R.;
Hidber, H.-R.;
Güntherodt, H.-J.;
Düggelin, M.;
Guggenheim, R.;
Schmidt, H.;
Güntherodt, G.

Publication type:

Article

Increasing the scanning speed of scanning tunnelling microscopes.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 387, doi. 10.1111/j.1365-2818.1988.tb01400.x

By:

Robinson, R. S.

Publication type:

Article

Investigation of intrinsic crystalline Si(111) and amorphous silicon surfaces in air with STM.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 481, doi. 10.1111/j.1365-2818.1988.tb01411.x

By:

Okoniewski, A. M.;
Yelon, A.

Publication type:

Article

Real space imaging of co-adsorbed CO and benzene molecules on Rh(111).

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 567, doi. 10.1111/j.1365-2818.1988.tb01422.x

By:

Chiangs, S.;
Wilson, R. J.;
Mate, C. M.;
Ohtani, H.

Publication type:

Article

Imaging of individual atoms on an Al(111) surface by scanning tunnelling microscopy.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 423, doi. 10.1111/j.1365-2818.1988.tb01404.x

By:

Wintterlin, J.;
Wiechers, J.;
Gritsch, Th.;
Höfer, H.;
Behm, R. J.

Publication type:

Article

Scanning tunnelling microscopy of oxidized graphite.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 515, doi. 10.1111/j.1365-2818.1988.tb01415.x

By:

Porte, L.;
Richard, D.;
Gallezot, P.

Publication type:

Article

Contact resistance and saturation effects in the scanning tunnelling microscope: the resistance quantum unit.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 317, doi. 10.1111/j.1365-2818.1988.tb01392.x

By:

Martín-Rodero, A.;
Ferrer, J.;
Flores, F.

Publication type:

Article

Electric field-induced changes of W(110) and W(111) tips.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 459, doi. 10.1111/j.1365-2818.1988.tb01408.x

By:

Neddermeyer, H.;
Drechsler, M.

Publication type:

Article

Real-time scanning tunnelling microscopy of surfaces under active electrochemical control.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 541, doi. 10.1111/j.1365-2818.1988.tb01419.x

By:

Robinson, R. S.

Publication type:

Article

In situ fabrication and regeneration of microtips for scanning tunnelling microscopy.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 355, doi. 10.1111/j.1365-2818.1988.tb01396.x

By:

Binh, Vu Thien

Publication type:

Article

Comparison of LEED and STM measurements of vicinal Si(111).

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 473, doi. 10.1111/j.1365-2818.1988.tb01410.x

By:

Wang, X.-S.;
Phaneuf, R. J.;
Williams, E. D.

Publication type:

Article

Anomalous voltage dependence of tunnelling microscopy in WSe2.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 521, doi. 10.1111/j.1365-2818.1988.tb01416.x

By:

Akari, S.;
Stachel, M.;
Birk, H.;
Schreck, E.;
Lux, M.;
Dransfeld, K.

Publication type:

Article

Photon emission experiments with the scanning tunnelling microscope.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 325, doi. 10.1111/j.1365-2818.1988.tb01393.x

By:

Coombs, J. H.;
Gimzewski, J. K.;
Reihl, B.;
Sass, J. K.;
Schlittler, R. R.

Publication type:

Article

STM imaging of molecular collagen and phospholipid membranes.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 557, doi. 10.1111/j.1365-2818.1988.tb01421.x

By:

Voelker, Mark A.;
Hameroff, Stuart R.;
He, Jackson D.;
Dereniak, Eustace L.;
McCuskey, Robert S.;
Schneiker, Conrad W.;
Chvapil, Thomas A.;
Bell, L. Stephen;
WEISS, Lawrence B.

Publication type:

Article

Nucleation and growth of Cu and Ag on Si(111)7×7.

Published in:

Journal of Microscopy, 1988, v. 152, n. 2, p. 415, doi. 10.1111/j.1365-2818.1988.tb01403.x

By:

Tosch, St.;
Neddermeyer, H.

Publication type:

Article

Works matching IS 00222720 AND DT 1988 AND VI 152 AND IP 2

Donor graphite intercalation compounds studied with a high stability STM.

Image Analysis and Mathematical Morphology. Volume 2: Theoretical Advances. Edited by J ean S erra.

The STM learning curve and where it may take us.

Study of Au surfaces by scanning tunnelling microscopy.

In situ, atomic scale observation of electrode topography and reactions.

A role of a tip geometry on STM images.

Finite element analysis of PZT tube scanner motion for scanning tunnelling microscopy.

STM of layered-structure semiconductors.

Measurements of polyphosphoric acid on HOPG.

Scanning tunnelling microscopy of 1-D and 2-D charge-density wave systems.

Scanning tunnelling engineering.

Scanning tunnelling microscopy and spectroscopy on Cu(111) and Au(111).

Investigation of Bloch wall fine structures by magnetic force microscopy.

Surface structures of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub>, BiCa<sub>1·7</sub>Sr<sub>0·7</sub>Cu<sub>2</sub>O<sub>x</sub> and TlCaBaCuO<sub>4·5±x</sub> investigated by scanning tunnelling microscopy.

A frictional force microscope controlled with an electromagnet.

STM study of the effects of pulsed laser irradiation on semiconductor surfaces.

Clean and metal-contaminated Si(110) surfaces studied by RHEED, XPS and STM.

Polymers on graphite and gold: molecular images and substrate defects.

STM study of the structure of the sulphur (1×2) overlayer on molybdenum (001) in air: ordered domains, phase boundaries and defects.

Design and operation of a variable temperature scanning tunnelling microscope.

STM and AFM investigations of high- T<sub>c</sub> superconductors.

Increasing the scanning speed of scanning tunnelling microscopes.

Investigation of intrinsic crystalline Si(111) and amorphous silicon surfaces in air with STM.

Real space imaging of co-adsorbed CO and benzene molecules on Rh(111).

Imaging of individual atoms on an Al(111) surface by scanning tunnelling microscopy.

Scanning tunnelling microscopy of oxidized graphite.

Contact resistance and saturation effects in the scanning tunnelling microscope: the resistance quantum unit.

Electric field-induced changes of W(110) and W(111) tips.

Real-time scanning tunnelling microscopy of surfaces under active electrochemical control.

In situ fabrication and regeneration of microtips for scanning tunnelling microscopy.

Comparison of LEED and STM measurements of vicinal Si(111).

Anomalous voltage dependence of tunnelling microscopy in WSe<sub>2</sub>.

Photon emission experiments with the scanning tunnelling microscope.

STM imaging of molecular collagen and phospholipid membranes.

Nucleation and growth of Cu and Ag on Si(111)7×7.