A method for observing intracellular structures of free cells by scanning electron microscopy.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 171, doi. 10.1111/j.1365-2818.1986.tb02713.x
- By:
- Publication type:
- Article
Works matching IS 00222720 AND DT 1986 AND VI 141 AND IP 2
Results: 10
1
2
Computer-aided integrating microdensitometry and specimen imaging with the Vickers M85A.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 213, doi. 10.1111/j.1365-2818.1986.tb02717.x
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- Publication type:
- Article
3
Pulsed laser atom probe analysis of semiconductor materials.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 155, doi. 10.1111/j.1365-2818.1986.tb02712.x
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- Publication type:
- Article
4
Raster images and measurement with a Vickers M86 scanning microdensitometer and interferometer by computer control.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 199, doi. 10.1111/j.1365-2818.1986.tb02716.x
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- Publication type:
- Article
5
GLUTARADEHYDE-INDUCED PERMEABILIZATION OF CELL MEMBRANES.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. RP3, doi. 10.1111/j.1365-2818.1986.tb02709.x
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- Publication type:
- Article
6
Enhanced oxygen diffusion and precipitation in silicon.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 143, doi. 10.1111/j.1365-2818.1986.tb02711.x
- By:
- Publication type:
- Article
7
Friable rock embedding in methyl methacrylate for thin-sectioning in geological preparations.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 193, doi. 10.1111/j.1365-2818.1986.tb02715.x
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- Publication type:
- Article
8
Characterization of defects in semiconductors by combined application of SEM(EBIC) and SDLTS.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 129, doi. 10.1111/j.1365-2818.1986.tb02710.x
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- Publication type:
- Article
9
Electron microscopy of unstained, freeze-dried macromolecular assemblies.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 179, doi. 10.1111/j.1365-2818.1986.tb02714.x
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- Publication type:
- Article
10
Electronic image formation in high-voltage TEM by sequential pixel acquisition.
- Published in:
- Journal of Microscopy, 1986, v. 141, n. 2, p. 223, doi. 10.1111/j.1365-2818.1986.tb02718.x
- By:
- Publication type:
- Article