Works matching IS 00222720 AND DT 1985 AND VI 140 AND IP 3
Results: 13
Resolution in low voltage scanning electron microscopy.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 283, doi. 10.1111/j.1365-2818.1985.tb02682.x
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- Publication type:
- Article
Microchannel plate detector for low voltage scanning electron microscopes.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 323, doi. 10.1111/j.1365-2818.1985.tb02686.x
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- Article
Low Voltage SEM.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 282, doi. 10.1111/j.1365-2818.1985.tb02681.x
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- Publication type:
- Article
A mirror electron microscope for surface analysis.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 395, doi. 10.1111/j.1365-2818.1985.tb02692.x
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- Publication type:
- Article
Stroboscopic testing of LSIs with low voltage scanning electron microscope.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 313, doi. 10.1111/j.1365-2818.1985.tb02685.x
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- Publication type:
- Article
The pair correlation function for point and fibre systems and its stereological determination by planar sections.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 361, doi. 10.1111/j.1365-2818.1985.tb02689.x
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- Article
Editorial.
- Published in:
- 1985
- By:
- Publication type:
- Editorial
The effect of subsurface topography on secondary electron images from chromate pretreated aluminium surfaces.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 383, doi. 10.1111/j.1365-2818.1985.tb02691.x
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- Publication type:
- Article
Thermal field emission for low voltage scanning electron microscopy.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 303, doi. 10.1111/j.1365-2818.1985.tb02684.x
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- Publication type:
- Article
Normarski differential interference microscopy study of the ferroelastic domains in NaCN, RbCN and KCN.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 351, doi. 10.1111/j.1365-2818.1985.tb02688.x
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- Publication type:
- Article
Laser scanning phase modulation microscope.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 371, doi. 10.1111/j.1365-2818.1985.tb02690.x
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- Publication type:
- Article
Point cathodes for use in virtual source electron optics.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 293, doi. 10.1111/j.1365-2818.1985.tb02683.x
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- Publication type:
- Article
Some recent developments in low voltage E-beam testing of ICs.
- Published in:
- Journal of Microscopy, 1985, v. 140, n. 3, p. 331, doi. 10.1111/j.1365-2818.1985.tb02687.x
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- Publication type:
- Article