Works matching IS 00222720 AND DT 1985 AND VI 140 AND IP 3

Results: 13

Resolution in low voltage scanning electron microscopy.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 283, doi. 10.1111/j.1365-2818.1985.tb02682.x

By:

Joy, David C.

Publication type:

Article

Microchannel plate detector for low voltage scanning electron microscopes.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 323, doi. 10.1111/j.1365-2818.1985.tb02686.x

By:

Russell, P. E.;
Mancuso, J. F.

Publication type:

Article

Low Voltage SEM.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 282, doi. 10.1111/j.1365-2818.1985.tb02681.x

By:

Joy, David

Publication type:

Article

A mirror electron microscope for surface analysis.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 395, doi. 10.1111/j.1365-2818.1985.tb02692.x

By:

Foster, M. S.;
Campuzano, J. C.;
Willis, R. F.;
Dupuy, J. C.

Publication type:

Article

Stroboscopic testing of LSIs with low voltage scanning electron microscope.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 313, doi. 10.1111/j.1365-2818.1985.tb02685.x

By:

Todokoro, H.;
Yoneda, S.;
Yamaguchi, K.;
Fukuhara, S.;
Komoda, T.

Publication type:

Article

The pair correlation function for point and fibre systems and its stereological determination by planar sections.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 361, doi. 10.1111/j.1365-2818.1985.tb02689.x

By:

Hanisch, Karl-Heinz;
König, Dieter;
Stoyan, Dietrich

Publication type:

Article

Editorial.

Published in:

1985

By:

Echlin, Patrick

Publication type:

Editorial

The effect of subsurface topography on secondary electron images from chromate pretreated aluminium surfaces.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 383, doi. 10.1111/j.1365-2818.1985.tb02691.x

By:

Treverton, J. A.;
Amor, M. P.

Publication type:

Article

Thermal field emission for low voltage scanning electron microscopy.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 303, doi. 10.1111/j.1365-2818.1985.tb02684.x

By:

Orloff, J.

Publication type:

Article

Normarski differential interference microscopy study of the ferroelastic domains in NaCN, RbCN and KCN.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 351, doi. 10.1111/j.1365-2818.1985.tb02688.x

By:

Gash, Philip;
Lüty, Fritz

Publication type:

Article

Laser scanning phase modulation microscope.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 371, doi. 10.1111/j.1365-2818.1985.tb02690.x

By:

Hansen, E. W.;
Allen, R. D.;
Strohbehn, J. W.;
Chaffee, M. A.;
Farrington, D. L.;
Murray, W. F.;
Pillsbury, T. A.;
Riley, M. F.

Publication type:

Article

Point cathodes for use in virtual source electron optics.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 293, doi. 10.1111/j.1365-2818.1985.tb02683.x

By:

Tuggle, D. W.;
Li, J. Z.;
Swanson, L. W.

Publication type:

Article

Some recent developments in low voltage E-beam testing of ICs.

Published in:

Journal of Microscopy, 1985, v. 140, n. 3, p. 331, doi. 10.1111/j.1365-2818.1985.tb02687.x

By:

Menzel, E.;
Buchanan, R.

Publication type:

Article