Works matching IS 00222720 AND DT 1984 AND VI 136 AND IP 2

Results: 14

Recent advances and applications of high resolution electron microscopy.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 127, doi. 10.1111/j.1365-2818.1984.tb00523.x

By:

Hutchison, J. L.

Publication type:

Article

Electron energy loss spectra and reflection images from surfaces.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 279, doi. 10.1111/j.1365-2818.1984.tb00534.x

By:

Howie, A.;
Milne, R. H.

Publication type:

Article

Understanding thin film X-ray spectra.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 179, doi. 10.1111/j.1365-2818.1984.tb00527.x

By:

Chapman, J. N.;
Nicholson, W. A. P.;
Crozier, P. A.

Publication type:

Article

Beam-Specimen Signals and their Interpretation.

Published in:: Journal of Microscopy, 1984, v. 136, n. 2, p. 125, doi. 10.1111/j.1365-2818.1984.tb00522.x
Publication type:: Article

Photoelectron emission: images and spectra.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 259, doi. 10.1111/j.1365-2818.1984.tb00533.x

By:

Turner, D. W.;
Plummer, I. R.;
Porter, H. Q.

Publication type:

Article

Applications of modern microdiffraction to materials science.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 165, doi. 10.1111/j.1365-2818.1984.tb00526.x

By:

Carpenter, R. W.;
Spence, J. C. H.

Publication type:

Article

Dynamical excitation of thermal diffuse scattering in crystals of rutile.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 153, doi. 10.1111/j.1365-2818.1984.tb00525.x

By:

Bursill, L. A.;
Rossouw, C. J.

Publication type:

Article

Beam interactions, contrast and resolution in the SEM.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 241, doi. 10.1111/j.1365-2818.1984.tb00532.x

By:

Joy, David C.

Publication type:

Article

On the use of ionization cross sections in analytical electron microscopy.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 209, doi. 10.1111/j.1365-2818.1984.tb00529.x

By:

Williams, D. B.;
Newbury, D. E.;
Goldstein, J. I.;
Fiori, C. E.

Publication type:

Article

Correcting electron energy loss spectra for artefacts introduced by a serial data collection system.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 227, doi. 10.1111/j.1365-2818.1984.tb00531.x

By:

Craven, A. J.;
Buggy, T. W.

Publication type:

Article

Problem oriented transmission electron microscopy.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 137, doi. 10.1111/j.1365-2818.1984.tb00524.x

By:

Stobbs, W. M.

Publication type:

Article

Surface structure imaging by electron microscopy.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 287, doi. 10.1111/j.1365-2818.1984.tb00535.x

By:

Takayanagi, K.

Publication type:

Article

The application of EDXS to the biological sciences.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 193, doi. 10.1111/j.1365-2818.1984.tb00528.x

By:

Hall, T. A.;
Gupta, B. L.

Publication type:

Article

Determination of UTW k<sub>XSi</sub> factors for seven elements from oxygen to iron.

Published in:

Journal of Microscopy, 1984, v. 136, n. 2, p. 219, doi. 10.1111/j.1365-2818.1984.tb00530.x

By:

Cliff, G.;
Maher, D. M.;
Joy, D. C.

Publication type:

Article