Works matching IS 00222720 AND DT 1984 AND VI 136 AND IP 2
Results: 14
Recent advances and applications of high resolution electron microscopy.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 127, doi. 10.1111/j.1365-2818.1984.tb00523.x
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Electron energy loss spectra and reflection images from surfaces.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 279, doi. 10.1111/j.1365-2818.1984.tb00534.x
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Understanding thin film X-ray spectra.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 179, doi. 10.1111/j.1365-2818.1984.tb00527.x
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Beam-Specimen Signals and their Interpretation.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 125, doi. 10.1111/j.1365-2818.1984.tb00522.x
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- Article
Photoelectron emission: images and spectra.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 259, doi. 10.1111/j.1365-2818.1984.tb00533.x
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Applications of modern microdiffraction to materials science.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 165, doi. 10.1111/j.1365-2818.1984.tb00526.x
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Beam interactions, contrast and resolution in the SEM.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 241, doi. 10.1111/j.1365-2818.1984.tb00532.x
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Dynamical excitation of thermal diffuse scattering in crystals of rutile.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 153, doi. 10.1111/j.1365-2818.1984.tb00525.x
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On the use of ionization cross sections in analytical electron microscopy.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 209, doi. 10.1111/j.1365-2818.1984.tb00529.x
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Correcting electron energy loss spectra for artefacts introduced by a serial data collection system.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 227, doi. 10.1111/j.1365-2818.1984.tb00531.x
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Problem oriented transmission electron microscopy.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 137, doi. 10.1111/j.1365-2818.1984.tb00524.x
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Surface structure imaging by electron microscopy.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 287, doi. 10.1111/j.1365-2818.1984.tb00535.x
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The application of EDXS to the biological sciences.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 193, doi. 10.1111/j.1365-2818.1984.tb00528.x
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Determination of UTW k<sub>XSi</sub> factors for seven elements from oxygen to iron.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 219, doi. 10.1111/j.1365-2818.1984.tb00530.x
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