Works matching IS 00222720 AND DT 1984 AND VI 135 AND IP 3
Results: 10
Accurate method of measuring grain misorientations and analysing grain boundary planes in TEM.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 241, doi. 10.1111/j.1365-2818.1984.tb02531.x
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Optimized acquisition parameters and statistical detection limit in quantitative EELS.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 295, doi. 10.1111/j.1365-2818.1984.tb02535.x
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Flash X-ray microscopy with a gas jet plasma source.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 347, doi. 10.1111/j.1365-2818.1984.tb02539.x
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Review of the principal contrast effects observed at interphase boundaries using transmission electron microscopy.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 213, doi. 10.1111/j.1365-2818.1984.tb02530.x
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Facility for rapid preparation of silicon and silicide TEM specimens.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 287, doi. 10.1111/j.1365-2818.1984.tb02534.x
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Geometric model of the rat intestinal mucosa for stereological evaluation of villus amplification factors.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 337, doi. 10.1111/j.1365-2818.1984.tb02538.x
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Improved imaging of phase gradients in scanning optical microscopy.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 275, doi. 10.1111/j.1365-2818.1984.tb02533.x
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Stereological estimation of average cell volume in monolayer culture by combined light and electron microscopy.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 325, doi. 10.1111/j.1365-2818.1984.tb02537.x
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An improved detection system for electrical microcharacterization in a scanning electron microscope.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 255, doi. 10.1111/j.1365-2818.1984.tb02532.x
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Design and application of a freeze-fracture stage with a cleaver device for Balzers 'freeze-etching' apparatus.
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- Journal of Microscopy, 1984, v. 135, n. 3, p. 317, doi. 10.1111/j.1365-2818.1984.tb02536.x
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- Article