Works matching IS 00222720 AND DT 1983 AND VI 130 AND IP 3
Results: 11
The role of specimen and instrumental parameters in STEM-EDS X-ray microanalysis of thin foils.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 377, doi. 10.1111/j.1365-2818.1983.tb04557.x
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Digital image processing of combined SEM and EDX signals.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 325, doi. 10.1111/j.1365-2818.1983.tb04552.x
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A method for mapping localized displacement fields in boundaries.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 361, doi. 10.1111/j.1365-2818.1983.tb04556.x
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The metallographic characteristics of fatigue cracks in the titanium alloy IMI829 at 400°C and 600°C.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 289, doi. 10.1111/j.1365-2818.1983.tb04549.x
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Field emission, developments and possibilities.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 309, doi. 10.1111/j.1365-2818.1983.tb04551.x
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Microstructural studies of the temperature-dependence of deformation structures around hardness indentations in ceramics.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 345, doi. 10.1111/j.1365-2818.1983.tb04555.x
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Dislocation structures in fatigued polycrystalline stainless steel.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 279, doi. 10.1111/j.1365-2818.1983.tb04548.x
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Indentation analysis: applications in the strength and wear of brittle materials.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 295, doi. 10.1111/j.1365-2818.1983.tb04550.x
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The use of a digitizing frame store in microscopy.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 339, doi. 10.1111/j.1365-2818.1983.tb04554.x
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The study of high temperature oxidation by transmission electron microscopy.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 263, doi. 10.1111/j.1365-2818.1983.tb04547.x
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Introduction to the microscopy of erosion.
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- Journal of Microscopy, 1983, v. 130, n. 3, p. 331, doi. 10.1111/j.1365-2818.1983.tb04553.x
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- Article