Combining accurate defocus with low-dose imaging in high resolution electron microscopy of biological material.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 225, doi. 10.1111/j.1365-2818.1983.tb04220.x
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- Publication type:
- Article
Works matching IS 00222720 AND DT 1983 AND VI 130 AND IP 2
Results: 13
1
2
ALCHEMI: a new technique for locating atoms in small crystals.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 147, doi. 10.1111/j.1365-2818.1983.tb04213.x
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- Publication type:
- Article
3
Procedures for focusing, stigmating and alignment in high resolution electron microscopy.
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- Journal of Microscopy, 1983, v. 130, n. 2, p. 187, doi. 10.1111/j.1365-2818.1983.tb04217.x
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- Publication type:
- Article
4
The application of high resolution electron microscopy to the study of oxidation.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 137, doi. 10.1111/j.1365-2818.1983.tb04212.x
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- Article
5
The relative importance of multiple inelastic scattering in the quantification of EELS.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 177, doi. 10.1111/j.1365-2818.1983.tb04216.x
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- Publication type:
- Article
6
Recent improvements to the Cambridge University 600 kV High Resolution Electron Microscope.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 127, doi. 10.1111/j.1365-2818.1983.tb04211.x
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- Publication type:
- Article
7
HREM and STEM of defects in multiply-twinned particles.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 249, doi. 10.1111/j.1365-2818.1983.tb04222.x
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- Publication type:
- Article
8
Prospects for improvement in EDX microanalysis.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 165, doi. 10.1111/j.1365-2818.1983.tb04215.x
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- Publication type:
- Article
9
The relative accuracy of axial and non-axial methods for the measurement of lattice spacings.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 215, doi. 10.1111/j.1365-2818.1983.tb04219.x
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- Publication type:
- Article
10
Condenser Aperture Misalignment and Solute Profile Asymmetries in STEM X-ray Microanalysis.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. RP3, doi. 10.1111/j.1365-2818.1983.tb04210.x
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- Publication type:
- Article
11
The transmission electron microscopy of oxide scale formation on Fe-Ni-Cr alloys.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 233, doi. 10.1111/j.1365-2818.1983.tb04221.x
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- Publication type:
- Article
12
Electron trajectory-linked phenomena in thin foil X-ray microanalysis.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 155, doi. 10.1111/j.1365-2818.1983.tb04214.x
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- Publication type:
- Article
13
A high-resolution electron microscopic study of defects in sodium β′″-alumina.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 2, p. 203, doi. 10.1111/j.1365-2818.1983.tb04218.x
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- Publication type:
- Article