Works matching IS 00222720 AND DT 1973 AND VI 98 AND IP 2
Results: 16
Observations of lattice defects using the weak-beam technique.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 180, doi. 10.1111/j.1365-2818.1973.tb03821.x
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The Weak-Beam Microscopy Symposium at EMCON 1972.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 115, doi. 10.1111/j.1365-2818.1973.tb03814.x
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Evidence of dislocation dissociation in nearly stoichiometric tantalum carbide using the weak-beam technique.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 209, doi. 10.1111/j.1365-2818.1973.tb03825.x
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Weak-beam observation of dislocation loops in silicon.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 165, doi. 10.1111/j.1365-2818.1973.tb03818.x
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Book Reviews.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 229, doi. 10.1111/j.1365-2818.1973.tb03829.x
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- Article
The determination of the 1/2<lll> {110} antiphase boundary energy of NiAl.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 174, doi. 10.1111/j.1365-2818.1973.tb03820.x
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The application of weak-beam imaging to studies of small dislocational loops.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 200, doi. 10.1111/j.1365-2818.1973.tb03824.x
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The determination of the geometry and nature of small Frank loops using the weak-beam method.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 155, doi. 10.1111/j.1365-2818.1973.tb03817.x
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Dislocation networks in tungsten carbide studied by the weak-beam technique.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 226, doi. 10.1111/j.1365-2818.1973.tb03828.x
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Four-fold dissociations of super-lattice dislocations.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 196, doi. 10.1111/j.1365-2818.1973.tb03823.x
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Calculations and observations of the weak-beam contrast of small lattice defects.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 135, doi. 10.1111/j.1365-2818.1973.tb03816.x
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Resolution of dense dislocation networks using the weak-beam technique.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 221, doi. 10.1111/j.1365-2818.1973.tb03827.x
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Transmission electron microscope observations of extended and unextended dislocation nodes in Si and Ge/Si layers using the weak-beam technique.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 191, doi. 10.1111/j.1365-2818.1973.tb03822.x
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The principles and practice of the weak-beam method of electron microscopy.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 116, doi. 10.1111/j.1365-2818.1973.tb03815.x
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Computer simulation of weak-beam images of extended dislocations in copper.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 214, doi. 10.1111/j.1365-2818.1973.tb03826.x
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Investigation of dislocation geometries in the diamond cubic structure.
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- Journal of Microscopy, 1973, v. 98, n. 2, p. 170, doi. 10.1111/j.1365-2818.1973.tb03819.x
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- Article