Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. 227, doi. 10.1093/jmicro/dfr013
- By:
- Publication type:
- Article
Works matching IS 00220744 AND DT 2011 AND VI 60 AND IP 3
Results: 12
1
2
Development of a high temperature–atmospheric pressure environmental cell for high-resolution TEM.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. 217, doi. 10.1093/jmicro/dfr011
- By:
- Publication type:
- Article
3
Collagen/hydroxyapatite composite materials with desired ceramic properties.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. 253, doi. 10.1093/jmicro/dfr010
- By:
- Publication type:
- Article
4
Editorial Board.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. NP, doi. 10.1093/jmicro/dfr042
- Publication type:
- Article
5
Novel nanofibrous scaffolds for water filtration with bacteria and virus removal capability.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. 201, doi. 10.1093/jmicro/dfr019
- By:
- Publication type:
- Article
6
Adaptation of the Tokuyasu method for the ultrastructural study and immunogold labelling of filamentous fungi.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. 211, doi. 10.1093/jmicro/dfr026
- By:
- Publication type:
- Article
7
Contents Page.
- Published in:
- 2011
- Publication type:
- Table of Contents
8
Electron holography study of remanence states in exchange-biased MnPd/Fe bilayers grown epitaxially on MgO(001).
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. 235, doi. 10.1093/jmicro/dfr015
- By:
- Publication type:
- Article
9
Subscription Page.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. NP, doi. 10.1093/jmicro/dfr043
- Publication type:
- Article
10
Cover Page.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. NP, doi. 10.1093/jmicro/dfr041
- Publication type:
- Article
11
JEM in this issue, 60:3 june 2011.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. NP, doi. 10.1093/jmicro/dfr039
- Publication type:
- Article
12
High-resolution three-dimensional scanning transmission electron microscopy characterization of oxide–nitride–oxide layer interfaces in Si-based semiconductors using computed tomography.
- Published in:
- Journal of Electron Microscopy, 2011, v. 60, n. 3, p. 243, doi. 10.1093/jmicro/dfr029
- By:
- Publication type:
- Article