Works matching IS 00220744 AND DT 2010 AND VI 59 AND IP S1
Results: 27
Energy-filtered imaging in a scanning electron microscope for dopant contrast in InP.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S183, doi. 10.1093/jmicro/dfq046
- By:
- Publication type:
- Article
Crack propagation of single crystal β-Sn during in situ TEM straining.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S61, doi. 10.1093/jmicro/dfq054
- By:
- Publication type:
- Article
Microstructures and electrical properties of TiO2-doped Al2O3 ceramics.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S107, doi. 10.1093/jmicro/dfq037
- By:
- Publication type:
- Article
In-situ analysis of optoelectronic properties of twin boundaries in AlGaAs by polarized cathodoluminescence spectroscopy in a TEM.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S141, doi. 10.1093/jmicro/dfq042
- By:
- Publication type:
- Article
Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S39, doi. 10.1093/jmicro/dfq048
- By:
- Publication type:
- Article
Dislocation structures and strain fields in [111] low-angle tilt grain boundaries in zirconia bicrystals.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S117, doi. 10.1093/jmicro/dfq038
- By:
- Publication type:
- Article
Prospects for 3D imaging of dopant atoms in ceramic interfaces.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S29, doi. 10.1093/jmicro/dfq029
- By:
- Publication type:
- Article
Preface.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S1, doi. 10.1093/jmicro/dfq049
- By:
- Publication type:
- Article
Phase-shifting electron holography for atomic image reconstruction.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S81, doi. 10.1093/jmicro/dfq033
- By:
- Publication type:
- Article
Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S155, doi. 10.1093/jmicro/dfq043
- By:
- Publication type:
- Article
Quantifying transient states in materials with the dynamic transmission electron microscope.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S67, doi. 10.1093/jmicro/dfq032
- By:
- Publication type:
- Article
Flexible formation of coherent probes on an aberration-corrected STEM with three condensers.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S15, doi. 10.1093/jmicro/dfq052
- By:
- Publication type:
- Article
Relationship between magnetic domain configuration and crystallographic orientation in a colossal magnetoresistive material.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S95, doi. 10.1093/jmicro/dfq035
- By:
- Publication type:
- Article
3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S55, doi. 10.1093/jmicro/dfq031
- By:
- Publication type:
- Article
Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S165, doi. 10.1093/jmicro/dfq044
- By:
- Publication type:
- Article
Characterization of oxide scales thermally formed on single-crystal silicon carbide.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S123, doi. 10.1093/jmicro/dfq039
- By:
- Publication type:
- Article
Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipment.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S189, doi. 10.1093/jmicro/dfq047
- By:
- Publication type:
- Article
Transmission electron microscopy study of a Y1-xSmxBa2Cu3Oy-coated conductor containing BaZrO3 particles.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S101, doi. 10.1093/jmicro/dfq036
- By:
- Publication type:
- Article
Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S7, doi. 10.1093/jmicro/dfq027
- By:
- Publication type:
- Article
Germanium network connecting precipitates in an Mg-rich Al–Mg–Ge alloy.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S129, doi. 10.1093/jmicro/dfq040
- By:
- Publication type:
- Article
Morphology and optical properties of single- and multi-layer InAs quantum dots.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S149, doi. 10.1093/jmicro/dfq053
- By:
- Publication type:
- Article
Discontinuous coarsening behavior of Ni2MnAl intermetallic compound during isothermal aging treatment of Fe–Mn–Ni–Al alloys.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S135, doi. 10.1093/jmicro/dfq041
- By:
- Publication type:
- Article
STEM image simulation by Bloch-wave method with layer-by-layer representation.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S23, doi. 10.1093/jmicro/dfq028
- By:
- Publication type:
- Article
In-situ TEM studies of the sintering behavior of copper nanoparticles covered by biopolymer nanoskin.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S75, doi. 10.1093/jmicro/dfq055
- By:
- Publication type:
- Article
Measurement of electric field distribution using a conventional transmission electron microscope.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S89, doi. 10.1093/jmicro/dfq034
- By:
- Publication type:
- Article
Scanning electron microscope observation of dislocations in semiconductor and metal materials.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S175, doi. 10.1093/jmicro/dfq045
- By:
- Publication type:
- Article
Dependence of beam broadening on detection angle in scanning transmission electron microtomography.
- Published in:
- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S45, doi. 10.1093/jmicro/dfq030
- By:
- Publication type:
- Article