Works matching IS 00220744 AND DT 2010 AND VI 59 AND IP S1

Results: 27

Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S39, doi. 10.1093/jmicro/dfq048

By:

Lu, Kangbo;
Sourty, Erwan;
Loos, Joachim

Publication type:

Article

Energy-filtered imaging in a scanning electron microscope for dopant contrast in InP.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S183, doi. 10.1093/jmicro/dfq046

By:

Tsurumi, Daisuke;
Hamada, Kotaro;
Kawasaki, Yuji

Publication type:

Article

Dislocation structures and strain fields in [111] low-angle tilt grain boundaries in zirconia bicrystals.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S117, doi. 10.1093/jmicro/dfq038

By:

Nohara, Yuki;
Tochigi, Eita;
Shibata, Naoya;
Yamamoto, Takahisa;
Ikuhara, Yuichi

Publication type:

Article

Characterization of oxide scales thermally formed on single-crystal silicon carbide.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S123, doi. 10.1093/jmicro/dfq039

By:

Chayasombat, B.;
Kato, T.;
Hirayama, T.;
Tokunaga, T.;
Sasaki, K.;
Kuroda, K.

Publication type:

Article

In-situ TEM studies of the sintering behavior of copper nanoparticles covered by biopolymer nanoskin.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S75, doi. 10.1093/jmicro/dfq055

By:

Ida, Kiyonobu;
Sugiyama, Yasuyuki;
Chujyo, Yuki;
Tomonari, Masanori;
Tokunaga, Tomoharu;
Sasaki, Katsuhiro;
Kuroda, Kotaro

Publication type:

Article

Microstructures and electrical properties of TiO2-doped Al2O3 ceramics.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S107, doi. 10.1093/jmicro/dfq037

By:

Unno, Hiroto;
Sato, Yutaka;
Toh, Shoichi;
Yoshinaga, Norito;
Matsumura, Syo

Publication type:

Article

Crack propagation of single crystal Î²-Sn during in situ TEM straining.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S61, doi. 10.1093/jmicro/dfq054

By:

Shang, P. J.;
Liu, Z. Q.;
Li, D. X.;
Shang, J. K.

Publication type:

Article

Preface.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S1, doi. 10.1093/jmicro/dfq049

By:

Matsumura, Syo

Publication type:

Article

In-situ analysis of optoelectronic properties of twin boundaries in AlGaAs by polarized cathodoluminescence spectroscopy in a TEM.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S141, doi. 10.1093/jmicro/dfq042

By:

Ohno, Yutaka

Publication type:

Article

Relationship between magnetic domain configuration and crystallographic orientation in a colossal magnetoresistive material.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S95, doi. 10.1093/jmicro/dfq035

By:

Yu, Xiuzhen;
Li, Run-Wei;
Asaka, Toru;
Ishizuka, Kazuo;
Kimoto, Koji;
Matsui, Yoshio

Publication type:

Article

3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S55, doi. 10.1093/jmicro/dfq031

By:

Tanaka, Masaki;
Honda, Masaki;
Sadamatsu, Sunao;
Higashida, Kenji

Publication type:

Article

Prospects for 3D imaging of dopant atoms in ceramic interfaces.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S29, doi. 10.1093/jmicro/dfq029

By:

Findlay, Scott D.;
Shibata, Naoya;
Azuma, Shinya;
Ikuhara, Yuichi

Publication type:

Article

STEM image simulation by Bloch-wave method with layer-by-layer representation.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S23, doi. 10.1093/jmicro/dfq028

By:

Morimura, Takao

Publication type:

Article

Flexible formation of coherent probes on an aberration-corrected STEM with three condensers.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S15, doi. 10.1093/jmicro/dfq052

By:

Feng Yi;
Tiemeijer, Peter;
Voyles, Paul M.

Publication type:

Article

Measurement of electric field distribution using a conventional transmission electron microscope.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S89, doi. 10.1093/jmicro/dfq034

By:

Sasaki, Katsuhiro;
Mori, Hiroto;
Tanaka, Nobuyuki;
Murata, Hidekazu;
Morita, Chiaki;
Shimoyama, Hiroshi;
Kuroda, Kotaro

Publication type:

Article

Scanning electron microscope observation of dislocations in semiconductor and metal materials.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S175, doi. 10.1093/jmicro/dfq045

By:

Kuwano, Noriyuki;
Itakura, Masaru;
Nagatomo, Yoshiyuki;
Tachibana, Shigeaki

Publication type:

Article

Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S165, doi. 10.1093/jmicro/dfq044

By:

Itakura, Masaru;
Kuwano, Noriyuki;
Sato, Kaoru;
Tachibana, Shigeaki

Publication type:

Article

Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipment.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S189, doi. 10.1093/jmicro/dfq047

By:

Ohya, Kaoru;
Inai, Kensuke;
Kawasaki, Ryosuke;
Saito, Misako;
Hayashi, Teruyuki;
Jau, Jack;
Kanai, Kenichi

Publication type:

Article

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S7, doi. 10.1093/jmicro/dfq027

By:

Sasaki, Takeo;
Sawada, Hidetaka;
Hosokawa, Fumio;
Kohno, Yuji;
Tomita, Takeshi;
Kaneyama, Toshikatsu;
Kondo, Yukihito;
Kimoto, Koji;
Sato, Yuta;
Suenaga, Kazu

Publication type:

Article

Transmission electron microscopy study of a Y1-xSmxBa2Cu3Oy-coated conductor containing BaZrO3 particles.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S101, doi. 10.1093/jmicro/dfq036

By:

Kato, Takeharu;
Miura, Masashi;
Yoshizumi, Masateru;
Yamada, Yutaka;
Izumi, Teruo;
Hirayama, Tsukasa;
Shiohara, Yuh

Publication type:

Article

Phase-shifting electron holography for atomic image reconstruction.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S81, doi. 10.1093/jmicro/dfq033

By:

Yamamoto, Kazuo;
Sugawara, Yoshihiro;
McCartney, Martha R.;
Smith, David J.

Publication type:

Article

Quantifying transient states in materials with the dynamic transmission electron microscope.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S67, doi. 10.1093/jmicro/dfq032

By:

Campbell, Geoffrey H.;
LaGrange, Thomas;
Kim, Judy S.;
Reed, Bryan W.;
Browning, Nigel D.

Publication type:

Article

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S155, doi. 10.1093/jmicro/dfq043

By:

Dingley, David J.;
Wilkinson, Angus J.;
Meaden, Graham;
Karamched, Phani S.

Publication type:

Article

Germanium network connecting precipitates in an Mg-rich Al–Mg–Ge alloy.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S129, doi. 10.1093/jmicro/dfq040

By:

Bjørge, Ruben;
Marioara, Calin D.;
Andersen, Sigmund J.;
Holmestad, Randi

Publication type:

Article

Discontinuous coarsening behavior of Ni2MnAl intermetallic compound during isothermal aging treatment of Fe–Mn–Ni–Al alloys.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S135, doi. 10.1093/jmicro/dfq041

By:

Yoon-Uk Heo;
Masaki Takeguchi;
Kazuo Furuya;
Hu-Chul Lee

Publication type:

Article

Morphology and optical properties of single- and multi-layer InAs quantum dots.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S149, doi. 10.1093/jmicro/dfq053

By:

Chiung-Chih Hsu;
Ray-Quen Hsu;
Yue-Han Wu

Publication type:

Article

Dependence of beam broadening on detection angle in scanning transmission electron microtomography.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S45, doi. 10.1093/jmicro/dfq030

By:

Motoki, Sohei;
Kaneko, Takeshi;
Aoyama, Yoshitaka;
Nishioka, Hideo;
Okura, Yoshihiro;
Kondo, Yukihito;
Jinnai, Hiroshi

Publication type:

Article