Works matching IS 00220744 AND DT 2010 AND VI 59 AND IP 5
1
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 419, doi. 10.1093/jmicro/dfq056
- Kishimoto-Okada, Aiko;
- Murakami, Satoshi;
- Ito, Yoshiko;
- Horii, Noritaka;
- Furukawa, Hiromitsu;
- Takagi, Junichi;
- Iwasaki, Kenji
- Article
2
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 387, doi. 10.1093/jmicro/dfq015
- Saitoh, Koh;
- Tatara, Yoshihide;
- Tanaka, Nobuo
- Article
3
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 331, doi. 10.1093/jmicro/dfq057
- Xia, Weixing;
- Hirata, Kei;
- Yanagisawa, Keiichi;
- Ishida, Yoichi;
- Kasai, Hiroto;
- Yanagiuchi, Katsuaki;
- Shindo, Daisuke;
- Tonomura, Akira
- Article
4
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 427, doi. 10.1093/jmicro/dfq021
- Narimatsu, Kaya;
- Li, Minqi;
- de Freitas, Paulo Henrique Luiz;
- Sultana, Sara;
- Ubaidus, Sobhan;
- Kojima, Taku;
- Zhucheng, Liu;
- Ying, Guo;
- Suzuki, Reiko;
- Yamamoto, Tsuneyuki;
- Oda, Kimimitsu;
- Amizuka, Norio
- Article
5
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 367, doi. 10.1093/jmicro/dfq016
- Saitoh, Koh;
- Yasuda, Yoshifumi;
- Hamabe, Maiko;
- Tanaka, Nobuo
- Article
6
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 437, doi. 10.1093/jmicro/dfq013
- Miguens, Flavio Costa;
- Oliveira, Martha Lima de;
- Marins, Rozane Valente;
- Lacerda, Luiz Drude de
- Article
7
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 451, doi. 10.1093/jmicro/dfq019
- Aziz, Nazneen;
- Jha, Ashish K.;
- Thanos, Chris;
- Basha, Riyaz;
- Bose, Arijit
- Article
8
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 351, doi. 10.1093/jmicro/dfq023
- Fujita, Shin;
- Takebe, Masahiro;
- Ohye, Toshimi
- Article
9
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 359, doi. 10.1093/jmicro/dfq018
- Coillot, Daniel;
- Podor, Renaud;
- Méar, François O.;
- Montagne, Lionel
- Article
10
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 379, doi. 10.1093/jmicro/dfq012
- Kim, Hyonchol;
- Negishi, Tsutomu;
- Kudo, Masato;
- Takei, Hiroyuki;
- Yasuda, Kenji
- Article
11
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 345, doi. 10.1093/jmicro/dfq025
- Adusumalli, Ramesh-Babu;
- Raghavan, Rejin;
- Schwaller, Patrick;
- Zimmermann, Tanja;
- Michler, Johann
- Article
12
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 321, doi. 10.1093/jmicro/dfq024
- Herring, Rodney A.;
- Saitoh, Koh;
- Tanaka, Nobuo;
- Tanji, Takayoshi
- Article
13
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. i, doi. 10.1093/jmicro/dfq074
- Article
14
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 447, doi. 10.1093/jmicro/dfq051
- Hirata, Eri;
- Sakaguchi, Norihito;
- Uo, Motohiro;
- Ushijima, Natsumi;
- Nodasaka, Yoshinobu;
- Watari, Fumio;
- Ichinose, Hideki;
- Yokoyama, Atsuro
- Article
15
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 409
- Wu, Hai-Shan;
- Dikman, Steven
- Article
16
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 339, doi. 10.1093/jmicro/dfq050
- Afzal, Asma Binat;
- Akhtar, Muhammad Javed;
- Ahmad, Maqsood
- Article
17
- Journal of Electron Microscopy, 2010, v. 59, n. 5, p. 395, doi. 10.1093/jmicro/dfq058
- Ohno, Shinichi;
- Terada, Nobuo;
- Ohno, Nobuhiko;
- Saitoh, Sei;
- Saitoh, Yurika;
- Fujii, Yasuhisa
- Article