Works matching IS 00220744 AND DT 2010 AND VI 59 AND IP 4
1
- Journal of Electron Microscopy, 2010, v. 59, n. 4, p. 299, doi. 10.1093/jmicro/dfq009
- Nakamura, Natsuko;
- Shimizu, Yuko;
- Shinkawa, Takao;
- Nakata, Munetaka;
- Bammes, Benjamin;
- Junjie Zhang;
- Wah Chiu
- Article
2
- Journal of Electron Microscopy, 2010, v. 59, n. 4, p. 273, doi. 10.1093/jmicro/dfq006
- Jin-Gyu Kim;
- Kyung Song;
- Kihyun Kwon;
- Kimin Hong;
- Youn-Joong Kim
- Article
3
- Journal of Electron Microscopy, 2010, v. 59, n. 4, p. 311, doi. 10.1093/jmicro/dfq011
- Yuqing Hao;
- Li Li;
- Wei Li;
- Xuedong Zhou;
- Junjun Lu
- Article
4
- Journal of Electron Microscopy, 2010, v. 59, n. 4, p. 251, doi. 10.1093/jmicro/dfq010
- Terauchi, Masami;
- Koike, Masato;
- Fukushima, Kurio;
- Kimura, Atsushi
- Article
5
- Journal of Electron Microscopy, 2010, v. 59, n. 4, p. 285, doi. 10.1093/jmicro/dfq004
- Peng Gao;
- Kaihui Liu;
- Lei Liu;
- Zhenzhong Wang;
- Zhaoliao Liao;
- Zhi Xu;
- Wenlong Wang;
- Xuedong Bai;
- Enge Wang;
- Yanqing Li
- Article
7
- Journal of Electron Microscopy, 2010, v. 59, n. 4, p. 263, doi. 10.1093/jmicro/dfq003
- Kogure, Toshihiro;
- Okunishi, Eiji
- Article
8
- Journal of Electron Microscopy, 2010, v. 59, n. 4, p. 291, doi. 10.1093/jmicro/dfq007
- Janczyk, Pawel;
- Hansen, Sophie;
- Bahramsoltani, Mahtab;
- Plendl, Johanna
- Article