Works matching IS 00220744 AND DT 2010 AND VI 59 AND IP 3
1
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 227, doi. 10.1093/jmicro/dfq002
- Minqi Li;
- Yukie Seki;
- Freitas, Paulo H.L.;
- Nagata, Masaki;
- Kojima, Taku;
- Sultana, Sara;
- Ubaidus, Sobhan;
- Maeda, Takeyasu;
- Shimomura, Junko;
- Henderson, Janet E.;
- Tamura, Masato;
- Oda, Kimimitsu;
- Zhusheng Liu;
- Ying Guo;
- Suzuki, Reiko;
- Yamamoto, Tsuneyuki;
- Takagi, Ritsuo;
- Amizuka, Norio
- Article
3
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 207, doi. 10.1093/jmicro/dfp062
- Akase, Zentaro;
- Shindo, Daisuke
- Article
4
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 187, doi. 10.1093/jmicro/dfp056
- Kodama, Tetsuya;
- Tomita, Noriko;
- Horie, Sachiko;
- Sax, Nicolas;
- Iwasaki, Hiroko;
- Suzuki, Ryo;
- Maruyama, Kazuo;
- Mori, Shiro;
- Manabu, Fukumoto
- Article
5
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 197, doi. 10.1093/jmicro/dfp060
- Tamura, Keiji;
- Okayama, Shigeo;
- Shimizu, Ryuichi
- Article
6
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 215, doi. 10.1093/jmicro/dfp059
- Murata, Kazuyoshi;
- Nishimura, Shinpei;
- Kuniyasu, Akihiko;
- Nakayama, Hitoshi
- Article
7
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 243, doi. 10.1093/jmicro/dfp058
- Desaki, Junzo;
- Ezaki, Taichi;
- Nishida, Naoya
- Article
9
- Journal of Electron Microscopy, 2010, v. 59, n. 3, p. 237, doi. 10.1093/jmicro/dfp057
- Zengwei Huang;
- Mukai Chen;
- Kunpeng Li;
- Xiaoduo Dong;
- Jiande Han;
- Qinfen Zhang
- Article