Works matching IS 00220744 AND DT 2010 AND VI 59 AND IP 1
1
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 33, doi. 10.1093/jmicro/dfp046
- Mitome, Masanori;
- Ishizuka, Kazuo;
- Bando, Yoshio
- Article
2
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 17, doi. 10.1093/jmicro/dfp043
- Hara, Toru;
- Tanaka, Keiichi;
- Maehata, Keisuke;
- Mitsuda, Kazuhisa;
- Yamasaki, Noriko Y.;
- Ohsaki, Mitsuaki;
- Watanabe, Katsuaki;
- Xiuzhen Yu;
- Ito, Takuji;
- Yamanaka, Yoshihiro
- Article
3
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 53, doi. 10.1093/jmicro/dfp036
- Zongli Li;
- Hite, Richard K.;
- Yifan Cheng;
- Walz, Thomas
- Article
4
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 43, doi. 10.1093/jmicro/dfp047
- Kohashi, Teruo;
- Konoto, Makoto;
- Koike, Kazuyuki
- Article
5
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 27, doi. 10.1093/jmicro/dfp044
- Foss, Steinar;
- Taftø, Johan;
- Haakenaasen, Randi
- Article
6
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 87, doi. 10.1093/jmicro/dfp040
- Pei-Yun Liu;
- Phillips, Gael E.;
- Kempf, Margit;
- Cuttle, Leila;
- Kimble, Roy M.;
- McMillan, James R.
- Article
7
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 71, doi. 10.1093/jmicro/dfp041
- Fortoul, Teresa Imelda;
- Vélez-Cruz, Madeleine;
- Antuna-Bizarro, Silvia;
- Montaño, Luis F.;
- Rodriguez-Lara, Vianey;
- Saldivar-Osorio, Liliana
- Article
8
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 65, doi. 10.1093/jmicro/dfp039
- O'Reilly, Jennifer N.;
- Cogger, Victoria C.;
- Le Couteur, David G.
- Article
9
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 3, doi. 10.1093/jmicro/dfp037
- Fujita, Shin;
- Takebe, Masahiro;
- Ushio, Wataru;
- Shimoyama, Hiroshi
- Article
10
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 79, doi. 10.1093/jmicro/dfp038
- Desaki, Junzo;
- Nishida, Naoya
- Article
11
- Journal of Electron Microscopy, 2010, v. 59, n. 1, p. 1, doi. 10.1093/jmicro/dfp061
- Article