Works matching IS 00220744 AND DT 2009 AND VI 58 AND IP 5
1
- Journal of Electron Microscopy, 2009, v. 58, n. 5, p. 281, doi. 10.1093/jmicro/dfp020
- Tanigaki, Toshiaki;
- Ito, Katsuji;
- Nagakubo, Yasuhira;
- Asakawa, Takayuki;
- Kanemura, Takashi
- Article
2
- Journal of Electron Microscopy, 2009, v. 58, n. 5, p. 321, doi. 10.1093/jmicro/dfp023
- Russa, Afadhali Denis;
- Maesawa, Chihaya;
- Satoh, Yoh-ichi
- Article
3
- Journal of Electron Microscopy, 2009, v. 58, n. 5, p. 295, doi. 10.1093/jmicro/dfp026
- Jingmin Zhang;
- Chao Yu;
- Zhimin Liao;
- Xinzheng Zhang;
- Liping You;
- Dapeng Yu
- Article
4
- Journal of Electron Microscopy, 2009, v. 58, n. 5, p. 301, doi. 10.1093/jmicro/dfp025
- Fujita, Takeshi;
- Chen, Mingwei
- Article
5
- Journal of Electron Microscopy, 2009, v. 58, n. 5, p. 305, doi. 10.1093/jmicro/dfp019
- Kyung Eun Lee;
- Ji Hui Kim;
- Min Kyo Jung;
- Tatsuo Arii;
- Jae-Sook Ryu;
- Sung Sik Han
- Article
6
- Journal of Electron Microscopy, 2009, v. 58, n. 5, p. 289, doi. 10.1093/jmicro/dfp027
- Kaneko, Kenji;
- Furuya, Kazuki;
- Hungria, Ana B.;
- Hernandez-Garrido, Juan-Carlos;
- Midgley, Paul A.;
- Onodera, Tsunenobu;
- Kasai, Hitoshi;
- Yaguchi, Yusuke;
- Oikawa, Hidetoshi;
- Nomura, Yohei;
- Harada, Hiroki;
- Ishihara, Tatsumi;
- Baba, Norio
- Article
7
- Journal of Electron Microscopy, 2009, v. 58, n. 5, p. 315, doi. 10.1093/jmicro/dfp024
- Suwalak, Sakol;
- Voravuthikunchai, Supayang P.
- Article