Works matching IS 00220744 AND DT 2009 AND VI 58 AND IP 4
1
- Journal of Electron Microscopy, 2009, v. 58, n. 4, p. 267, doi. 10.1093/jmicro/dfp017
- Shuji Yamashita;
- Osamu Katsumata;
- Yasunori Okada
- Article
2
- Journal of Electron Microscopy, 2009, v. 58, n. 4, p. 245, doi. 10.1093/jmicro/dfp018
- Daisuke Shindo;
- Kodai Takahashi;
- Yasukazu Murakami;
- Kazuya Yamazaki;
- Syunji Deguchi;
- Hiroaki Suga;
- Yukihito Kondo
- Article
3
- Journal of Electron Microscopy, 2009, v. 58, n. 4, p. 261, doi. 10.1093/jmicro/dfp013
- Masashi Yamaguchi;
- Hitoshi Okada;
- Yuichi Namiki
- Article
4
- Journal of Electron Microscopy, 2009, v. 58, n. 4, p. 251, doi. 10.1093/jmicro/dfp002
- Auke J. Been;
- Gerrit A. Folkertsma;
- Hein H.J. Verputten;
- Thijs Bolhuis;
- Leon Abelmann
- Article
5
- Journal of Electron Microscopy, 2009, v. 58, n. 4, p. 253, doi. 10.1093/jmicro/dfp010
- Helmut Bartels;
- Andreas Schmiedl;
- Johannes Rosenbruch;
- Ian C. Potter
- Article
