Electron beam coherence measurements using diffracted beam interferometry/holography.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 213, doi. 10.1093/jmicro/dfn027
- Publication type:
- Article
Works matching IS 00220744 AND DT 2009 AND VI 58 AND IP 3
Results: 17
1
2
Review of recent advances in spectrum imaging and its extension to reciprocal space.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 99, doi. 10.1093/jmicro/dfp022
- By:
- Publication type:
- Article
3
Evolution of gold structure during thermal treatment of Au/FeOx catalysts revealed by aberration-corrected electron microscopy.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 199, doi. 10.1093/jmicro/dfp016
- By:
- Publication type:
- Article
4
Advanced electron microscopy in materials physics.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 73, doi. 10.1093/jmicro/dfp014
- By:
- Publication type:
- Article
5
Historical aspects of aberration correction.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 77, doi. 10.1093/jmicro/dfp012
- Publication type:
- Article
6
Control of parasitic aberrations in multipole optics.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 123, doi. 10.1093/jmicro/dfp015
- Publication type:
- Article
7
Three-dimensional electron microscopy of individual nanoparticles.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 175, doi. 10.1093/jmicro/dfn028
- By:
- Publication type:
- Article
8
Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 223, doi. 10.1093/jmicro/dfp007
- By:
- Publication type:
- Article
9
Atomic-resolution spectroscopic imaging: past, present and future.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 87, doi. 10.1093/jmicro/dfn030
- By:
- Publication type:
- Article
10
Phase TEM for biological imaging utilizing a Boersch electrostatic phase plate: theory and practice.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 137, doi. 10.1093/jmicro/dfp006
- By:
- Publication type:
- Article
11
Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 157, doi. 10.1093/jmicro/dfn029
- By:
- Publication type:
- Article
12
Three-dimensional shapes and structures of lamellar-twinned fcc nanoparticles using ADF STEM.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 167, doi. 10.1093/jmicro/dfp003
- By:
- Publication type:
- Article
13
Aberration-corrected Z-contrast imaging of SrTiO3 dislocation cores.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 185, doi. 10.1093/jmicro/dfn026
- By:
- Publication type:
- Article
14
Aberration-corrected STEM investigation of the M2 phase of MoVNbTeO selective oxidation catalyst.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 193, doi. 10.1093/jmicro/dfn025
- By:
- Publication type:
- Article
15
Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 131, doi. 10.1093/jmicro/dfn023
- By:
- Publication type:
- Article
16
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 147, doi. 10.1093/jmicro/dfp021
- By:
- Publication type:
- Article
17
Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 111, doi. 10.1093/jmicro/dfp011
- By:
- Publication type:
- Article