A high-throughput approach for cross-sectional transmission electron microscopy sample preparation of thin films.
- Published in:
- Journal of Electron Microscopy, 2008, v. 57, n. 6, p. 189, doi. 10.1093/jmicro/dfn021
- By:
- Publication type:
- Article
Works matching IS 00220744 AND DT 2008 AND VI 57 AND IP 6
Results: 5
1
2
A new device for high-pressure freezing of cultured cell monolayer using 10-{micro}m-thin stainless discs as both culture plate and specimen carrier.
- Published in:
- Journal of Electron Microscopy, 2008, v. 57, n. 6, p. 203
- By:
- Publication type:
- Article
3
Quantitative and easy estimation of a crystal bending effect using low-order CBED patterns.
- Published in:
- Journal of Electron Microscopy, 2008, v. 57, n. 6, p. 181, doi. 10.1093/jmicro/dfn019
- By:
- Publication type:
- Article
4
Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling.
- Published in:
- Journal of Electron Microscopy, 2008, v. 57, n. 6, p. 175, doi. 10.1093/jmicro/dfn018
- By:
- Publication type:
- Article
5
Rapid autotuning for crystalline specimens from an inline hologram.
- Published in:
- Journal of Electron Microscopy, 2008, v. 57, n. 6, p. 195
- By:
- Publication type:
- Article