Works matching IS 00220744 AND DT 2008 AND VI 57 AND IP 5
1
- Journal of Electron Microscopy, 2008, v. 57, n. 5, p. 169, doi. 10.1093/jmicro/dfn017
- Liping Yang;
- Zhongtang Zhao;
- Boqin Li;
- Yunxi Liu;
- Yueqiu Feng
- Article
2
- Journal of Electron Microscopy, 2008, v. 57, n. 5, p. 159, doi. 10.1093/jmicro/dfn016
- Norihito Sakaguchi;
- Fumio Watari;
- Atsuro Yokoyama;
- Yoshinobu Nodasaka
- Article
3
- Journal of Electron Microscopy, 2008, v. 57, n. 5, p. 165, doi. 10.1093/jmicro/dfn015
- Marco Beleggia;
- Giulio Pozzi
- Article
4
- Journal of Electron Microscopy, 2008, v. 57, n. 5, p. 149, doi. 10.1093/jmicro/dfn014
- Yusuke Sasano;
- Shunsuke Muto
- Article
