Works matching IS 00220744 AND DT 2008 AND VI 57 AND IP 4
1
- Journal of Electron Microscopy, 2008, v. 57, n. 4, p. 133, doi. 10.1093/jmicro/dfn013
- Tetsuo Kodaka;
- Akihiko Hirayama;
- Tsuneyoshi Sano;
- Kazuhiro Debari;
- Mitsuori Mayahara;
- Masanori Nakamura
- Article
2
- Journal of Electron Microscopy, 2008, v. 57, n. 4, p. 129, doi. 10.1093/jmicro/dfn012
- Yohei Sato;
- Masami Terauchi;
- Yahachi Saito;
- Kentaro Sato;
- Riichiro Saito
- Article
3
- Journal of Electron Microscopy, 2008, v. 57, n. 4, p. 143, doi. 10.1093/jmicro/dfn011
- Article
4
- Journal of Electron Microscopy, 2008, v. 57, n. 4, p. 123, doi. 10.1093/jmicro/dfn010
- Masaki Takeguchi;
- Ayako Hashimoto;
- Masayuki Shimojo;
- Kazutaka Mitsuishi;
- Kazuo Furuya
- Article
5
- Journal of Electron Microscopy, 2008, v. 57, n. 4, p. 119, doi. 10.1093/jmicro/dfn009
- Article