Works matching IS 00220744 AND DT 2008 AND VI 57 AND IP 2
1
- Journal of Electron Microscopy, 2008, v. 57, n. 2, p. 53, doi. 10.1093/jmicro/dfn003
- Ki Hyun Kim;
- Joong Jung Kim;
- Toshiaki Suzuki;
- Daisuke Shindo
- Article
2
- Journal of Electron Microscopy, 2008, v. 57, n. 2, p. 67, doi. 10.1093/jmicro/dfn002
- Jan Hobot;
- Michael Walker;
- Geoffrey Newman;
- Philip Bowler
- Article
3
- Journal of Electron Microscopy, 2008, v. 57, n. 2, p. 41, doi. 10.1093/jmicro/dfn001
- Shigeto Isakozawa;
- Kazutoshi Kaji;
- Konrad Jarausch;
- Shohei Terada;
- Norio Baba
- Article
4
- Journal of Electron Microscopy, 2008, v. 57, n. 2, p. 47, doi. 10.1093/jmicro/dfm041
- Article
5
- Journal of Electron Microscopy, 2008, v. 57, n. 2, p. 77, doi. 10.1093/jmicro/dfm039
- Junzo Desaki;
- Naoya Nishida
- Article
6
- Journal of Electron Microscopy, 2008, v. 57, n. 2, p. 59, doi. 10.1093/jmicro/dfm040
- Article